Gilliot, M., En Naciri, A., Johann, L., d’Orleans, C., Muller, D., Stoquert, J.P., Grob, J.J. (2006) Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers. Applied Surface Science, 253. 389-394 doi:10.1016/j.apsusc.2006.06.020
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers | ||
Journal | Applied Surface Science | ||
Authors | Gilliot, M. | Author | |
En Naciri, A. | Author | ||
Johann, L. | Author | ||
d’Orleans, C. | Author | ||
Muller, D. | Author | ||
Stoquert, J.P. | Author | ||
Grob, J.J. | Author | ||
Year | 2006 (October) | Volume | 253 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.apsusc.2006.06.020Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9909346 | Long-form Identifier | mindat:1:5:9909346:0 |
GUID | 0 | ||
Full Reference | Gilliot, M., En Naciri, A., Johann, L., d’Orleans, C., Muller, D., Stoquert, J.P., Grob, J.J. (2006) Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers. Applied Surface Science, 253. 389-394 doi:10.1016/j.apsusc.2006.06.020 | ||
Plain Text | Gilliot, M., En Naciri, A., Johann, L., d’Orleans, C., Muller, D., Stoquert, J.P., Grob, J.J. (2006) Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers. Applied Surface Science, 253. 389-394 doi:10.1016/j.apsusc.2006.06.020 | ||
In | (n.d.) Applied Surface Science Vol. 253. Elsevier BV |
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