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Turek, Wincenty, Lapkowski, Mieczyslaw, Krowiak, Agnieszka, Teterycz, Helena, Klimkiewicz, Roman (2007) Evaluation of semiconducting sensor materials on the basis of catalytic test reaction. Applied Surface Science, 253. 5920-5924 doi:10.1016/j.apsusc.2007.02.062

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Reference TypeJournal (article/letter/editorial)
TitleEvaluation of semiconducting sensor materials on the basis of catalytic test reaction
JournalApplied Surface Science
AuthorsTurek, WincentyAuthor
Lapkowski, MieczyslawAuthor
Krowiak, AgnieszkaAuthor
Teterycz, HelenaAuthor
Klimkiewicz, RomanAuthor
Year2007 (April)Volume253
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2007.02.062Search in ResearchGate
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Mindat Ref. ID9909596Long-form Identifiermindat:1:5:9909596:3
GUID0
Full ReferenceTurek, Wincenty, Lapkowski, Mieczyslaw, Krowiak, Agnieszka, Teterycz, Helena, Klimkiewicz, Roman (2007) Evaluation of semiconducting sensor materials on the basis of catalytic test reaction. Applied Surface Science, 253. 5920-5924 doi:10.1016/j.apsusc.2007.02.062
Plain TextTurek, Wincenty, Lapkowski, Mieczyslaw, Krowiak, Agnieszka, Teterycz, Helena, Klimkiewicz, Roman (2007) Evaluation of semiconducting sensor materials on the basis of catalytic test reaction. Applied Surface Science, 253. 5920-5924 doi:10.1016/j.apsusc.2007.02.062
In(n.d.) Applied Surface Science Vol. 253. Elsevier BV

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