Zhong, X.L., Wang, J.B., Yang, S.X., Zhou, Y.C. (2006) Dependence of excess bismuth content in precursor sols on ferroelectric and dielectric properties of Bi 3.25 La 0.75 Ti 3 O 12 thin films fabricated by chemical solution deposition. Applied Surface Science, 253. 417-420 doi:10.1016/j.apsusc.2005.12.034

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Reference Type	Journal (article/letter/editorial)
Title	Dependence of excess bismuth content in precursor sols on ferroelectric and dielectric properties of Bi 3.25 La 0.75 Ti 3 O 12 thin films fabricated by chemical solution deposition
Journal	Applied Surface Science
Authors	Zhong, X.L.		Author
	Wang, J.B.		Author
	Yang, S.X.		Author
	Zhou, Y.C.		Author
Year	2006 (November)	Volume	253
Publisher	Elsevier BV
DOI	doi:10.1016/j.apsusc.2005.12.034Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	9910020	Long-form Identifier	mindat:1:5:9910020:1
GUID	0
Full Reference	Zhong, X.L., Wang, J.B., Yang, S.X., Zhou, Y.C. (2006) Dependence of excess bismuth content in precursor sols on ferroelectric and dielectric properties of Bi 3.25 La 0.75 Ti 3 O 12 thin films fabricated by chemical solution deposition. Applied Surface Science, 253. 417-420 doi:10.1016/j.apsusc.2005.12.034
Plain Text	Zhong, X.L., Wang, J.B., Yang, S.X., Zhou, Y.C. (2006) Dependence of excess bismuth content in precursor sols on ferroelectric and dielectric properties of Bi 3.25 La 0.75 Ti 3 O 12 thin films fabricated by chemical solution deposition. Applied Surface Science, 253. 417-420 doi:10.1016/j.apsusc.2005.12.034
In	(n.d.) Applied Surface Science Vol. 253. Elsevier BV

	Zhong, X.L., Wang, J.B., Zhou, Y.C., Liu, J.J., Zheng, X.J. (2005) Electrical properties of Nd-substituted Bi4Ti3O12 thin films fabricated by chemical solution deposition. Journal of Crystal Growth, 277 (1). 233-237 doi:10.1016/j.jcrysgro.2004.12.140
	Liao, M., Zhong, X.L., Qiao, Y., Wang, J.B., Zhou, Y.C., Liao, H. (2009) Effects of film thickness on microstructure and properties of Bi3.15Nd0.85Ti3O12 thin films fabricated by chemical solution deposition. Journal of Alloys and Compounds, 487. 331-334 doi:10.1016/j.jallcom.2009.07.142
	Chen, T., Wang, J.B., Zhong, X.L., Zeng, Y.K., Wang, F., Zhou, Y.C. (2013) Improved energy storage properties of PbZrO3 thin films by inserting 0.88BaTiO3–0.12Bi(Mg1/2,Ti1/2)O3 layer. Applied Surface Science, 285. 744-747 doi:10.1016/j.apsusc.2013.08.119
	Zhang, Z.H., Zhong, X.L., Liao, H., Wang, F., Wang, J.B., Zhou, Y.C. (2011) Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy. Applied Surface Science, 257. 7461-7465 doi:10.1016/j.apsusc.2011.03.015
	Wang, J.B., Li, P.J., Zhong, X.L. (2011) The crystalline orientation and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films mediated by the intermediate layer of LaNiO3. Applied Surface Science, 257. 4171-4174 doi:10.1016/j.apsusc.2010.12.014
	Hwang, J.-Y, Lee, S.-A, Jeong, S.-Y, Cho, C.-R (2006) Temperature-dependent fatigue rate in ferroelectric Bi 3.25 La 0.75 Ti 3 O 12 thin films. Europhysics Letters (EPL), 76. 88-94 doi:10.1209/epl/i2005-10604-2
	Shuang, D., Zhu, X.X., Wang, J.B., Zhong, X.L., Huang, G.J., He, C. (2011) The influence of Mn content on luminescence properties in Mn-doped ZnO films deposited by ultrasonic spray assisted chemical vapor deposition. Applied Surface Science, 257. 6085-6088 doi:10.1016/j.apsusc.2011.02.001
	Wang, Zan, Jiang, Wei, Li, San-xi, Tong, Jun-sheng (2016) Effects of 60 Co γ-ray irradiation on microstructure and ferroelectric properties of Bi 3.25 La 0.75 Ti 3 O 12 thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 366. 1-5 doi:10.1016/j.nimb.2015.10.005
	Feng, Lixin, Wang, Youwen, Yan, Yueyue, Cao, Guanghan, Jiao, Zhengkuan (2006) Growth of highly-oriented CaCu 3 Ti 4 O 12 thin films on SrTiO 3 (1 0 0) substrates by a chemical solution route. Applied Surface Science, 253. 2268-2271 doi:10.1016/j.apsusc.2006.04.029
	Zhong, X.L., Li, B., Wang, J.B., Liao, M., Liao, H., Zhou, Y.C. (2008) Ferroelectric properties of Mn-Doped Bi3.15Nd0.85Ti3O12 thin films prepared under different annealing conditions. Materials Letters, 62. 2891-2893 doi:10.1016/j.matlet.2008.01.065
	Gautam, Prikshit, Sachdeva, Anupama, Singh, Sushil K., Tandon, R.P. (2014) Dielectric functions and energy band gap variation studies of manganese doped Bi 3.25 La 0.75 Ti 3 O 12 thin films using spectroscopic ellipsometry. Journal of Alloys and Compounds, 617. 374-378 doi:10.1016/j.jallcom.2014.07.216

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