Çolakoğlu, T., Parlak, M. (2008) Structural characterization of polycrystalline Ag–In–Se thin films deposited by e-beam technique. Applied Surface Science, 254. 1569-1577 doi:10.1016/j.apsusc.2007.07.092
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Structural characterization of polycrystalline Ag–In–Se thin films deposited by e-beam technique | ||
Journal | Applied Surface Science | ||
Authors | Çolakoğlu, T. | Author | |
Parlak, M. | Author | ||
Year | 2008 (January) | Volume | 254 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.apsusc.2007.07.092Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9912085 | Long-form Identifier | mindat:1:5:9912085:2 |
GUID | 0 | ||
Full Reference | Çolakoğlu, T., Parlak, M. (2008) Structural characterization of polycrystalline Ag–In–Se thin films deposited by e-beam technique. Applied Surface Science, 254. 1569-1577 doi:10.1016/j.apsusc.2007.07.092 | ||
Plain Text | Çolakoğlu, T., Parlak, M. (2008) Structural characterization of polycrystalline Ag–In–Se thin films deposited by e-beam technique. Applied Surface Science, 254. 1569-1577 doi:10.1016/j.apsusc.2007.07.092 | ||
In | (n.d.) Applied Surface Science Vol. 254. Elsevier BV |
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