Dallaeva, Dinara, Ţălu, Ştefan, Stach, Sebastian, Škarvada, Pavel, Tománek, Pavel, Grmela, Lubomír (2014) AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 312. 81-86 doi:10.1016/j.apsusc.2014.05.086
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates | ||
| Journal | Applied Surface Science | ||
| Authors | Dallaeva, Dinara | Author | |
| Ţălu, Ştefan | Author | ||
| Stach, Sebastian | Author | ||
| Škarvada, Pavel | Author | ||
| Tománek, Pavel | Author | ||
| Grmela, Lubomír | Author | ||
| Year | 2014 (September) | Volume | 312 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.apsusc.2014.05.086Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9923323 | Long-form Identifier | mindat:1:5:9923323:5 |
| GUID | 0 | ||
| Full Reference | Dallaeva, Dinara, Ţălu, Ştefan, Stach, Sebastian, Škarvada, Pavel, Tománek, Pavel, Grmela, Lubomír (2014) AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 312. 81-86 doi:10.1016/j.apsusc.2014.05.086 | ||
| Plain Text | Dallaeva, Dinara, Ţălu, Ştefan, Stach, Sebastian, Škarvada, Pavel, Tománek, Pavel, Grmela, Lubomír (2014) AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Applied Surface Science, 312. 81-86 doi:10.1016/j.apsusc.2014.05.086 | ||
| In | (n.d.) Applied Surface Science Vol. 312. Elsevier BV | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
