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Junda, Maxwell M., Karki Gautam, Laxmi, Collins, Robert W., Podraza, Nikolas J. (2018) Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis. Applied Surface Science, 436. 779-784 doi:10.1016/j.apsusc.2017.12.039

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Reference TypeJournal (article/letter/editorial)
TitleOptical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis
JournalApplied Surface Science
AuthorsJunda, Maxwell M.Author
Karki Gautam, LaxmiAuthor
Collins, Robert W.Author
Podraza, Nikolas J.Author
Year2018 (April)Volume436
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2017.12.039Search in ResearchGate
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Mindat Ref. ID9933487Long-form Identifiermindat:1:5:9933487:1
GUID0
Full ReferenceJunda, Maxwell M., Karki Gautam, Laxmi, Collins, Robert W., Podraza, Nikolas J. (2018) Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis. Applied Surface Science, 436. 779-784 doi:10.1016/j.apsusc.2017.12.039
Plain TextJunda, Maxwell M., Karki Gautam, Laxmi, Collins, Robert W., Podraza, Nikolas J. (2018) Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis. Applied Surface Science, 436. 779-784 doi:10.1016/j.apsusc.2017.12.039
In(n.d.) Applied Surface Science Vol. 436. Elsevier BV

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