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Li, Wangwang, Liang, Ting, Liu, Wenyi, Lei, Cheng, Hong, Yingping, Li, Yongwei, Li, Zhiqiang, Xiong, Jijun (2019) Interface characteristics comparison of sapphire direct and indirect wafer bonded structures by transmission electron microscopy. Applied Surface Science, 494. 566-574 doi:10.1016/j.apsusc.2019.07.130

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Reference TypeJournal (article/letter/editorial)
TitleInterface characteristics comparison of sapphire direct and indirect wafer bonded structures by transmission electron microscopy
JournalApplied Surface Science
AuthorsLi, WangwangAuthor
Liang, TingAuthor
Liu, WenyiAuthor
Lei, ChengAuthor
Hong, YingpingAuthor
Li, YongweiAuthor
Li, ZhiqiangAuthor
Xiong, JijunAuthor
Year2019 (November)Volume494
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2019.07.130Search in ResearchGate
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Mindat Ref. ID9939170Long-form Identifiermindat:1:5:9939170:6
GUID0
Full ReferenceLi, Wangwang, Liang, Ting, Liu, Wenyi, Lei, Cheng, Hong, Yingping, Li, Yongwei, Li, Zhiqiang, Xiong, Jijun (2019) Interface characteristics comparison of sapphire direct and indirect wafer bonded structures by transmission electron microscopy. Applied Surface Science, 494. 566-574 doi:10.1016/j.apsusc.2019.07.130
Plain TextLi, Wangwang, Liang, Ting, Liu, Wenyi, Lei, Cheng, Hong, Yingping, Li, Yongwei, Li, Zhiqiang, Xiong, Jijun (2019) Interface characteristics comparison of sapphire direct and indirect wafer bonded structures by transmission electron microscopy. Applied Surface Science, 494. 566-574 doi:10.1016/j.apsusc.2019.07.130
In(n.d.) Applied Surface Science Vol. 494. Elsevier BV

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