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Jian, Nan, Xue, Peidong, Diao, Dongfeng (2019) Thermally induced atomic and electronic structure evolution in nanostructured carbon film by in situ TEM/EELS analysis. Applied Surface Science, 498. 143831pp. doi:10.1016/j.apsusc.2019.143831

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Reference TypeJournal (article/letter/editorial)
TitleThermally induced atomic and electronic structure evolution in nanostructured carbon film by in situ TEM/EELS analysis
JournalApplied Surface Science
AuthorsJian, NanAuthor
Xue, PeidongAuthor
Diao, DongfengAuthor
Year2019 (December)Volume498
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2019.143831Search in ResearchGate
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Mindat Ref. ID9939596Long-form Identifiermindat:1:5:9939596:0
GUID0
Full ReferenceJian, Nan, Xue, Peidong, Diao, Dongfeng (2019) Thermally induced atomic and electronic structure evolution in nanostructured carbon film by in situ TEM/EELS analysis. Applied Surface Science, 498. 143831pp. doi:10.1016/j.apsusc.2019.143831
Plain TextJian, Nan, Xue, Peidong, Diao, Dongfeng (2019) Thermally induced atomic and electronic structure evolution in nanostructured carbon film by in situ TEM/EELS analysis. Applied Surface Science, 498. 143831pp. doi:10.1016/j.apsusc.2019.143831
In(n.d.) Applied Surface Science Vol. 498. Elsevier BV

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