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Cao, Kun, Jie, Wanqi, Zha, Gangqiang, Dong, Jiangpeng, Li, Yang, Wu, Sihong, Wang, Yawei, Zhang, Hao, Lin, Yun (2020) Origin and evolution of threading dislocation in CdZnTe(0 0 1)/GaAs(0 0 1) epilayer grown by close spaced sublimation. Applied Surface Science, 504. 144431pp. doi:10.1016/j.apsusc.2019.144431

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Reference TypeJournal (article/letter/editorial)
TitleOrigin and evolution of threading dislocation in CdZnTe(0 0 1)/GaAs(0 0 1) epilayer grown by close spaced sublimation
JournalApplied Surface Science
AuthorsCao, KunAuthor
Jie, WanqiAuthor
Zha, GangqiangAuthor
Dong, JiangpengAuthor
Li, YangAuthor
Wu, SihongAuthor
Wang, YaweiAuthor
Zhang, HaoAuthor
Lin, YunAuthor
Year2020 (February)Volume504
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2019.144431Search in ResearchGate
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Mindat Ref. ID9940116Long-form Identifiermindat:1:5:9940116:4
GUID0
Full ReferenceCao, Kun, Jie, Wanqi, Zha, Gangqiang, Dong, Jiangpeng, Li, Yang, Wu, Sihong, Wang, Yawei, Zhang, Hao, Lin, Yun (2020) Origin and evolution of threading dislocation in CdZnTe(0 0 1)/GaAs(0 0 1) epilayer grown by close spaced sublimation. Applied Surface Science, 504. 144431pp. doi:10.1016/j.apsusc.2019.144431
Plain TextCao, Kun, Jie, Wanqi, Zha, Gangqiang, Dong, Jiangpeng, Li, Yang, Wu, Sihong, Wang, Yawei, Zhang, Hao, Lin, Yun (2020) Origin and evolution of threading dislocation in CdZnTe(0 0 1)/GaAs(0 0 1) epilayer grown by close spaced sublimation. Applied Surface Science, 504. 144431pp. doi:10.1016/j.apsusc.2019.144431
In(n.d.) Applied Surface Science Vol. 504. Elsevier BV


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