Candela, Thibault, Renard, François, Bouchon, Michel, Brouste, Alexandre, Marsan, David, Schmittbuhl, Jean, Voisin, Christophe (2009) Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements. Pure and Applied Geophysics, 166 (10) 1817-1851 doi:10.1007/s00024-009-0521-2
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements | ||
Journal | Pure and Applied Geophysics | ||
Authors | Candela, Thibault | Author | |
Renard, François | Author | ||
Bouchon, Michel | Author | ||
Brouste, Alexandre | Author | ||
Marsan, David | Author | ||
Schmittbuhl, Jean | Author | ||
Voisin, Christophe | Author | ||
Year | 2009 (October) | Volume | 166 |
Issue | 10 | ||
Publisher | Springer Science and Business Media LLC | ||
DOI | doi:10.1007/s00024-009-0521-2Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 994093 | Long-form Identifier | mindat:1:5:994093:6 |
GUID | 0 | ||
Full Reference | Candela, Thibault, Renard, François, Bouchon, Michel, Brouste, Alexandre, Marsan, David, Schmittbuhl, Jean, Voisin, Christophe (2009) Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements. Pure and Applied Geophysics, 166 (10) 1817-1851 doi:10.1007/s00024-009-0521-2 | ||
Plain Text | Candela, Thibault, Renard, François, Bouchon, Michel, Brouste, Alexandre, Marsan, David, Schmittbuhl, Jean, Voisin, Christophe (2009) Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements. Pure and Applied Geophysics, 166 (10) 1817-1851 doi:10.1007/s00024-009-0521-2 | ||
In | (2009, October) Pure and Applied Geophysics Vol. 166 (10) Springer Science and Business Media LLC |
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