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Das, V. Damodara, Jayaprakash, N. (1982) Lattice distortion energy spectra of as-grown bismuth thin films and their thickness dependence. Journal of Materials Science, 17. 1369-1376 doi:10.1007/bf00752248

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Reference TypeJournal (article/letter/editorial)
TitleLattice distortion energy spectra of as-grown bismuth thin films and their thickness dependence
JournalJournal of Materials Science
AuthorsDas, V. DamodaraAuthor
Jayaprakash, N.Author
Year1982 (May)Volume17
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00752248Search in ResearchGate
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Mindat Ref. ID9985503Long-form Identifiermindat:1:5:9985503:7
GUID0
Full ReferenceDas, V. Damodara, Jayaprakash, N. (1982) Lattice distortion energy spectra of as-grown bismuth thin films and their thickness dependence. Journal of Materials Science, 17. 1369-1376 doi:10.1007/bf00752248
Plain TextDas, V. Damodara, Jayaprakash, N. (1982) Lattice distortion energy spectra of as-grown bismuth thin films and their thickness dependence. Journal of Materials Science, 17. 1369-1376 doi:10.1007/bf00752248
In(n.d.) Journal of Materials Science Vol. 17. Springer Science and Business Media LLC

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Damodara Das, V., Jayaprakash, N., Soundararajan, N. (1981) Thermoelectric power of tellurium thin films and its thickness and temperature dependence. Journal of Materials Science, 16. 3331-3334 doi:10.1007/bf00586294
Das, V. Damodara, Jayapraxash, N. (1981) Initial lattice distortion energy spectra of bismuth thin films and the effect of deposition rate. physica status solidi (a), 68 (2). doi:10.1002/pssa.2210680254
Das, V. Damodara (1982) Microstructure of vacuum-deposited tin thin films. Journal of Materials Science, 17. 2613-2617 doi:10.1007/bf00543895
Das, V. Damodara, Vaidehi, S. (1982) Variation of energy gap and resistivity minimum position with thickness in bismuth thin films. physica status solidi (a), 71 (2). 351-356 doi:10.1002/pssa.2210710208
Das, V. Damodara, Soundararajan, N. (1989) Size and temperature dependence of thermoelectric power and electrical resistivity of vacuum-deposited antimony thin films. Journal of Materials Science, 24. 4315-4323 doi:10.1007/bf00544505
Das, V. Damodara, Jagadeesh, M. S. (1982) Electrical conductivity, defect density and structure of obliquely vacuum-deposited tin antimonide alloy thin films. Journal of Materials Science, 17. 671-676 doi:10.1007/bf00540363
Das, V. Damodara, Vaidehi, S. (1984) Semiconducting behaviour of thin bismuth films vacuum-deposited at different substrate temperatures. Journal of Materials Science, 19. 1185-1190 doi:10.1007/bf01120028
Das, V. Damodara, Karunakaran, D. (1990) Thickness dependence of the phase transition temperature in Ag2Se thin films. Journal of Applied Physics, 68 (5). 2105-2111 doi:10.1063/1.346565
Damodara Das, V., Selvaraj, S. (1999) Thickness and temperature dependence of electrical properties of Bi2(Te0.1Se0.9)3 thin films. Journal of Applied Physics, 86 (3). 1518-1522 doi:10.1063/1.370923
Das, V. Damodara, Karunakaran, D. (1983) Semiconducting behavior of Ag2Te thin films and the dependence of band gap on thickness. Journal of Applied Physics, 54 (9). 5252-5255 doi:10.1063/1.332753
Das, V. Damodara (1984) Modified equations for the evaluation of energy distribution of defects in as‐grown thin films by Vand’s theory. Journal of Applied Physics, 55 (4). 1023-1028 doi:10.1063/1.333195
 
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