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Arshak, K. I., Al-Ramadhan, F. A. S., Hogarth, C. A. (1984) Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films. Journal of Materials Science, 19. 1505-1509 doi:10.1007/bf00563045

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Reference TypeJournal (article/letter/editorial)
TitleElectron spin resonance and some electrical and optical properties of GeO2/SiO x thin films
JournalJournal of Materials Science
AuthorsArshak, K. I.Author
Al-Ramadhan, F. A. S.Author
Hogarth, C. A.Author
Year1984 (May)Volume19
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00563045Search in ResearchGate
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Mindat Ref. ID9986390Long-form Identifiermindat:1:5:9986390:2
GUID0
Full ReferenceArshak, K. I., Al-Ramadhan, F. A. S., Hogarth, C. A. (1984) Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films. Journal of Materials Science, 19. 1505-1509 doi:10.1007/bf00563045
Plain TextArshak, K. I., Al-Ramadhan, F. A. S., Hogarth, C. A. (1984) Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films. Journal of Materials Science, 19. 1505-1509 doi:10.1007/bf00563045
In(n.d.) Journal of Materials Science Vol. 19. Springer Science and Business Media LLC

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Al-Ramadhan, F. A. S., Arshak, K. I., Hogarth, C. A. (1984) Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5. Journal of Materials Science, 19. 3687-3691 doi:10.1007/bf02396941
Al-Ramadhan, F. A. S., Hogarth, C. A. (1984) Some electrical properties of thin film sandwich assemblies of SiO/V2O5. Journal of Materials Science, 19. 1718-1725 doi:10.1007/bf00563070
Arshak, K., Hogarth, C. A., Ilyas, M. (1984) A study of electron spin resonance and optical absorption edge in amorphous mixed films of SiO and In2O3. Journal of Materials Science Letters, 3 (12) 1035-1038 doi:10.1007/bf00719756
Al-Ani, S. K. J., Arshak, K. I., Hogarth, C. A. (1984) The optical absorption edge of amorphous thin films of silicon monoxide. Journal of Materials Science, 19. 1737-1748 doi:10.1007/bf00550243
Al-Ismail, S. A. Y., Arshak, K., Hogarth, C. A. (1985) Electron Spin Resonance Measurements and Electrical Characteristics, before and after Electroforming, of Thin Films of SiO/Nb205 and Nb205. physica status solidi (a), 89 (1). 363-374 doi:10.1002/pssa.2210890138
Islam, M. H., Hogarth, C. A., Lott, K. A. (1989) Electron spin resonance and electrical properties of co-evaporated SiO/SnO2 thin films. Journal of Materials Science, 24. 1305-1308 doi:10.1007/bf02397063
Islam, M. H., Hogarth, C. A., Lott, K. A. (1989) Electron spin resonance and electrical properties of co-evaporated SiO/SnO2 thin films. Journal of Materials Science, 24. 1305-1308 doi:10.1007/pl00020212
Hogarth, C. A., Islam, M. H., Rahman, A. S. M. S. (1993) D.c. and a.c. electrical properties of vacuum evaporated thin SiO/GeO2 films. Journal of Materials Science, 28. 518-528 doi:10.1007/bf00357833
Al-Ramadhan, F. A. S., Hogarth, C. A. (1984) Observation and compositional studies of the metallic conducting filaments in the low-resistance state (ON-state) of SiO/V2O5 thin films used as memory elements. Journal of Materials Science, 19. 1939-1946 doi:10.1007/bf00550264
Al-Ani, S. K. J., Sarkar, M. A. R., Beynon, J., Hogarth, C. A. (1985) On the optical properties of Mn/SiO and SiO thin films. Journal of Materials Science, 20. 1637-1644 doi:10.1007/bf00555267
Al-Ani, S. K. J., Hogarth, C. A. (1985) The optical properties of amorphous V2O5 and SiO thin films and of the mixed dielectric system SiO/V2O5. Journal of Materials Science, 20. 1185-1192 doi:10.1007/bf01026312
 
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