Reference Type | Journal (article/letter/editorial) |
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Title | X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal |
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Journal | Journal of Materials Science |
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Authors | Elban, W. L. | Author |
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Armstrong, R. W. | Author |
Yoo, K. C. | Author |
Rosemeier, R. G. | Author |
Yee, R. Y. | Author |
Year | 1989 (April) | Volume | 24 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf02397058Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9989413 | Long-form Identifier | mindat:1:5:9989413:3 |
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GUID | 0 |
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Full Reference | Elban, W. L., Armstrong, R. W., Yoo, K. C., Rosemeier, R. G., Yee, R. Y. (1989) X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal. Journal of Materials Science, 24. 1273-1280 doi:10.1007/bf02397058 |
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Plain Text | Elban, W. L., Armstrong, R. W., Yoo, K. C., Rosemeier, R. G., Yee, R. Y. (1989) X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal. Journal of Materials Science, 24. 1273-1280 doi:10.1007/bf02397058 |
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In | (n.d.) Journal of Materials Science Vol. 24. Springer Science and Business Media LLC |
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