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Lohner, Tivadar, Kalas, Benjamin, Petrik, Peter, Zolnai, Zsolt, Serényi, Miklós, Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences, 8. 826pp. doi:10.3390/app8050826

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Reference TypeJournal (article/letter/editorial)
TitleRefractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory
JournalApplied Sciences
AuthorsLohner, TivadarAuthor
Kalas, BenjaminAuthor
Petrik, PeterAuthor
Zolnai, ZsoltAuthor
Serényi, MiklósAuthor
Sáfrán, GyörgyAuthor
Year2018 (May 21)Volume8
PublisherMDPI AG
DOIdoi:10.3390/app8050826Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10096813Long-form Identifiermindat:1:5:10096813:6
GUID0
Full ReferenceLohner, Tivadar, Kalas, Benjamin, Petrik, Peter, Zolnai, Zsolt, Serényi, Miklós, Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences, 8. 826pp. doi:10.3390/app8050826
Plain TextLohner, Tivadar, Kalas, Benjamin, Petrik, Peter, Zolnai, Zsolt, Serényi, Miklós, Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences, 8. 826pp. doi:10.3390/app8050826
In(n.d.) Applied Sciences Vol. 8. MDPI AG

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