Sáfrán, György (2018) “One-sample concept” micro-combinatory for high throughput TEM of binary films. Ultramicroscopy, 187. 50-55 doi:10.1016/j.ultramic.2018.01.001

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Reference Type	Journal (article/letter/editorial)
Title	“One-sample concept” micro-combinatory for high throughput TEM of binary films
Journal	Ultramicroscopy
Authors	Sáfrán, György		Author
Year	2018 (April)	Volume	187
Publisher	Elsevier BV
DOI	doi:10.1016/j.ultramic.2018.01.001Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4911596	Long-form Identifier	mindat:1:5:4911596:1
GUID	0
Full Reference	Sáfrán, György (2018) “One-sample concept” micro-combinatory for high throughput TEM of binary films. Ultramicroscopy, 187. 50-55 doi:10.1016/j.ultramic.2018.01.001
Plain Text	Sáfrán, György (2018) “One-sample concept” micro-combinatory for high throughput TEM of binary films. Ultramicroscopy, 187. 50-55 doi:10.1016/j.ultramic.2018.01.001
In	(2018) Ultramicroscopy Vol. 187. Elsevier BV

	Lohner, Tivadar, Kalas, Benjamin, Petrik, Peter, Zolnai, Zsolt, Serényi, Miklós, Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. Applied Sciences, 8. 826pp. doi:10.3390/app8050826
	*Sáfrán, György, Szász, Noémi, Sáfrán, Eszter (2015) Two-In-one sample preparation for plan-VIew TEM. Microscopy Research and Technique, 78 (7). 599-602 doi:10.1002/jemt.22513*
	*Cao, L., Zhu, Y., Wang, X. (2023) A novel method of high-throughput micro-and nanomechanical sample fabrication. Ultramicroscopy, 248. 113714 doi:10.1016/j.ultramic.2023.113714*
	*Uzuhashi, Jun, Ohkubo, Tadakatsu (2024) Systematic study of FIB-induced damage for the high-quality TEM sample preparation. Ultramicroscopy, 262. 113980 doi:10.1016/j.ultramic.2024.113980*
	*Miyata, Tomohiro, Mizoguchi, Teruyasu (2017) Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements. Ultramicroscopy, 178. 81-87 doi:10.1016/j.ultramic.2016.10.009*
	*Kang, Sangjun, Wang, Di, Kübel, Christian, Mu, Xiaoke (2024) Importance of TEM sample thickness for measuring strain fields. Ultramicroscopy, 255. 113844 doi:10.1016/j.ultramic.2023.113844*
	*Miller, Benjamin K., Barker, Trevor M., Crozier, Peter A. (2015) Novel sample preparation for operando TEM of catalysts. Ultramicroscopy, 156. 18-22 doi:10.1016/j.ultramic.2015.05.003*
	*Sasaki, Takeo, Sawada, Hidetaka, Hosokawa, Fumio, Sato, Yuta, Suenaga, Kazu (2014) Aberration-corrected STEM/TEM imaging at 15 kV. Ultramicroscopy, 145. 50-55 doi:10.1016/j.ultramic.2014.04.006*
	Voisin, Thomas, Grapes, Michael D., Zhang, Yong, Lorenzo, Nicholas, Ligda, Jonathan, Schuster, Brian, Weihs, Timothy P. (2017) TEM sample preparation by femtosecond laser machining and ion milling for high-rate TEM straining experiments. Ultramicroscopy, 175. 1-8 doi:10.1016/j.ultramic.2016.12.001
	Dieterle, Levin, Butz, Benjamin, Müller, Erich (2011) Optimized Ar+-ion milling procedure for TEM cross-section sample preparation. Ultramicroscopy, 111 (11). 1636-1644 doi:10.1016/j.ultramic.2011.08.014
	Sinha, Ankur, Ischia, Gloria, Straffelini, Giovanni, Gialanella, Stefano (2021) A new sample preparation protocol for SEM and TEM particulate matter analysis. Ultramicroscopy, 230. 113365pp. doi:10.1016/j.ultramic.2021.113365

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Sáfrán, György (2018) “One-sample concept” micro-combinatory for high throughput TEM of binary films. Ultramicroscopy, 187. 50-55 doi:10.1016/j.ultramic.2018.01.001

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