Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

ASPAR, B., BERJOAN, R., ARMAS, B., PERARNAU, D. (1993) AES characterization and depth profiles measurements of AIN thin films on SiO2 substrates. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993321

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAES characterization and depth profiles measurements of AIN thin films on SiO2 substrates
JournalLe Journal de Physique IV
AuthorsASPAR, B.Author
BERJOAN, R.Author
ARMAS, B.Author
PERARNAU, D.Author
Year1993 (August)Volume3
PublisherEDP Sciences
DOIdoi:10.1051/jp4:1993321Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10296031Long-form Identifiermindat:1:5:10296031:2
GUID0
Full ReferenceASPAR, B., BERJOAN, R., ARMAS, B., PERARNAU, D. (1993) AES characterization and depth profiles measurements of AIN thin films on SiO2 substrates. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993321
Plain TextASPAR, B., BERJOAN, R., ARMAS, B., PERARNAU, D. (1993) AES characterization and depth profiles measurements of AIN thin films on SiO2 substrates. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993321
In(n.d.) Le Journal de Physique IV Vol. 3. EDP Sciences

See Also

These are possibly similar items as determined by title/reference text matching only.

Berjoan, R., Perarnau, D., Caussat, B. (1999) XPS study of CVD silicon thin films deposited on various substrates from SiH4 gaseous precursor. Le Journal de Physique IV, 9. doi:10.1051/jp4:19998142
HENRY, F., ARMAS, B., BALAT, M., BERJOAN, R., COMBESCURE, C. (1993) A study of AlN-Si3N4 codeposits using the L.P.C.V.D. technique. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993372
ASPAR, B., ARMAS, B., COMBESCURE, C., THENEGAL, D. (1991) CHEMICAL VAPOUR DEPOSITION OF THE Al-O-N SYSTEM. Le Journal de Physique IV, 2. doi:10.1051/jp4:1991280
Berjoan, R., Biche, E., Perarnau, D., Roualdes, S., Durand, J. (1999) XPS and XPS valence band characterizations of amorphous or polymeric silicon based thin films prepared by PACVD from organosilicon monomers. Le Journal de Physique IV, 9. doi:10.1051/jp4:19998132
SANTISO, J., FIGUERAS, A. (1993) YBa2Cu3O7-x thin films deposition on YSZ substrates by MOCVD. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993348
UEDONO, A., WEI, L., TANIGAWA, S., SUZUKI, R., OHGAKI, H., MIKADO, T. (1993) Characterization of SiO2 films grown on Si substrates by monoenergetic positron beams. Le Journal de Physique IV, 3. 177-183 doi:10.1051/jp4:1993424
Lecoeur, P., Blanc-Guillon, B., Murray, H., Mercey, B. (1994) High Tc superconductive thin films on semiconductor substrates. Le Journal de Physique IV, 4. doi:10.1051/jp4:1994629
LABATUT, C., COMBESCURE, C., ARMAS, B. (1993) LPCVD of Al2O3 layers using a hot-wall reactor. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993381
LELOGEAIS, M., DUCARROIR, M., BERJOAN, R. (1991) ADHERENCE AND PROPERTIES OF SILICON CARBIDE BASED FILMS ON STEEL. Le Journal de Physique IV, 2. doi:10.1051/jp4:1991272
GERBER, Th., HIMMEL, B. (1993) SAXS- and ASAXS-investigation of TiO2-SiO2 gels. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993880
DUCARROIR, M., ZHANG, W., BERJOAN, R. (1993) SiCN coatings prepared by PACVD from TMS-NH3-Ar system on steel. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993333
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Β© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 19, 2025 14:39:11
Go to top of page