Reference Type | Journal (article/letter/editorial) |
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Title | Thickness and Oxygen Partial Pressure Dependence on Optical Band Gap of Indium Oxide by Reactive Evaporation Method |
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Journal | Journal of Applied Sciences |
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Authors | Muhammed A, A.V. | Author |
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Kekuda, Dhananjaya | Author |
Year | 2012 (December 1) | Volume | 12 |
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Publisher | Science Alert |
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DOI | doi:10.3923/jas.2012.1718.1721Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10342370 | Long-form Identifier | mindat:1:5:10342370:0 |
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GUID | 0 |
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Full Reference | Muhammed A, A.V., Kekuda, Dhananjaya (2012) Thickness and Oxygen Partial Pressure Dependence on Optical Band Gap of Indium Oxide by Reactive Evaporation Method. Journal of Applied Sciences, 12. 1718-1721 doi:10.3923/jas.2012.1718.1721 |
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Plain Text | Muhammed A, A.V., Kekuda, Dhananjaya (2012) Thickness and Oxygen Partial Pressure Dependence on Optical Band Gap of Indium Oxide by Reactive Evaporation Method. Journal of Applied Sciences, 12. 1718-1721 doi:10.3923/jas.2012.1718.1721 |
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In | (n.d.) Journal of Applied Sciences Vol. 12. Science Alert |
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