Reference Type | Journal (article/letter/editorial) |
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Title | Thickness and oxygen partial pressure dependence on optical band gap of indium oxide by reactive evaporation method |
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Journal | IOP Conference Series: Materials Science and Engineering |
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Authors | Ali, A V Muhammed | Author |
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Kekuda, Dhananjaya | Author |
Year | 2015 (February 17) | Volume | 73 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1757-899x/73/1/012027Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9778030 | Long-form Identifier | mindat:1:5:9778030:4 |
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GUID | 0 |
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Full Reference | Ali, A V Muhammed, Kekuda, Dhananjaya (2015) Thickness and oxygen partial pressure dependence on optical band gap of indium oxide by reactive evaporation method. IOP Conference Series: Materials Science and Engineering, 73. 12027pp. doi:10.1088/1757-899x/73/1/012027 |
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Plain Text | Ali, A V Muhammed, Kekuda, Dhananjaya (2015) Thickness and oxygen partial pressure dependence on optical band gap of indium oxide by reactive evaporation method. IOP Conference Series: Materials Science and Engineering, 73. 12027pp. doi:10.1088/1757-899x/73/1/012027 |
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In | (n.d.) IOP Conference Series: Materials Science and Engineering Vol. 73. IOP Publishing |
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