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Collett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (24). 2190 doi:10.1103/physrevlett.52.2190.2

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Reference TypeJournal (article/letter/editorial)
TitleSynchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films
JournalPhysical Review Letters
AuthorsCollett, JeffreyAuthor
Pershan, P. S.Author
Sirota, Eric B.Author
Sorensen, L. B.Author
Year1984 (June 11)Volume52
Issue24
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.52.2190.2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10541978Long-form Identifiermindat:1:5:10541978:7
GUID0
Full ReferenceCollett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (24). 2190 doi:10.1103/physrevlett.52.2190.2
Plain TextCollett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (24). 2190 doi:10.1103/physrevlett.52.2190.2
In(1984, June) Physical Review Letters Vol. 52 (24) American Physical Society (APS)

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Collett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (5). 356-359 doi:10.1103/physrevlett.52.356
Sirota, E. B., Pershan, P. S., Sorensen, L. B., Collett, J. (1987) X-ray and optical studies of the thickness dependence of the phase diagram of liquid-crystal films. Physical Review A, 36 (6). 2890-2901 doi:10.1103/physreva.36.2890
Sirota, E. B., Pershan, P. S., Sorensen, L. B., Collett, J. (1985) X-Ray Studies of Tilted Hexatic Phases in Thin Liquid-Crystal Films. Physical Review Letters, 55 (19). 2039-2042 doi:10.1103/physrevlett.55.2039
Hirth, J. P., Pershan, P. S., Collett, J., Sirota, E., Sorensen, L. B. (1984) Dislocation Model for Restacking Phase Transitions in Crystalline-BLiquid Crystals. Physical Review Letters, 53 (5). 473-476 doi:10.1103/physrevlett.53.473
Sirota, E. B., Pershan, P. S., Amador, Suzanne, Sorensen, L. B. (1987) Synchrotron x-ray observation of surface smectic-Ihexatic layers on smectic-Cliquid-crystal films. Physical Review A, 35 (5). 2283-2287 doi:10.1103/physreva.35.2283
Collett, J., Sorensen, L. B., Pershan, P. S., Litster, J. D., Birgeneau, R. J., Als-Nielsen, J. (1982) Synchrotron X-Ray Study of Novel Crystalline-BPhases in Heptyloxybenzylidene-Heptylaniline (7O.7). Physical Review Letters, 49 (8). 553-556 doi:10.1103/physrevlett.49.553
Collett, Jeffrey, Sorensen, L. B., Pershan, P. S., Als-Nielsen, J. (1985) X-ray scattering study of restacking transitions in the crystalline-Bphases of heptyloxybenzylidene heptylaniline (7O.7). Physical Review A, 32 (2). 1036-1043 doi:10.1103/physreva.32.1036
Amador, S., Pershan, P. S., Stragier, H., Swanson, B. D., Tweet, D. J., Sorensen, L. B., Sirota, E. B., Ice, G. E., Habenschuss, A. (1989) Synchrotron studies of the first-order melting transitions of hexatic monolayers and multilayers in freely suspended liquid-crystal films. Physical Review A, 39 (5). 2703-2708 doi:10.1103/physreva.39.2703
Chan, K. K., Pershan, P. S., Sorensen, L. B., Hardouin, F. (1985) X-Ray Scattering Study of the Smectic-A1to Smectic-A2Transition. Physical Review Letters, 54 (15). 1694-1697 doi:10.1103/physrevlett.54.1694
Moncton, D. E., Pindak, R., Davey, S. C., Brown, G. S. (1982) Melting of Variable-Thickness Liquid-Crystal Thin Films: A Synchrotron X-Ray Study. Physical Review Letters, 49 (25). 1865-1868 doi:10.1103/physrevlett.49.1865
Pershan, P. S., Als-Nielsen, J. (1984) X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations. Physical Review Letters, 52 (9). 759-762 doi:10.1103/physrevlett.52.759
 
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