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Pershan, P. S., Als-Nielsen, J. (1984) X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations. Physical Review Letters, 52 (9). 759-762 doi:10.1103/physrevlett.52.759

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Reference TypeJournal (article/letter/editorial)
TitleX-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations
JournalPhysical Review Letters
AuthorsPershan, P. S.Author
Als-Nielsen, J.Author
Year1984 (February 27)Volume52
Issue9
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.52.759Search in ResearchGate
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Mindat Ref. ID10542227Long-form Identifiermindat:1:5:10542227:5
GUID0
Full ReferencePershan, P. S., Als-Nielsen, J. (1984) X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations. Physical Review Letters, 52 (9). 759-762 doi:10.1103/physrevlett.52.759
Plain TextPershan, P. S., Als-Nielsen, J. (1984) X-Ray Reflectivity from the Surface of a Liquid Crystal: Surface Structure and Absolute Value of Critical Fluctuations. Physical Review Letters, 52 (9). 759-762 doi:10.1103/physrevlett.52.759
In(1984, February) Physical Review Letters Vol. 52 (9) American Physical Society (APS)

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Als-Nielsen, J., Christensen, F., Pershan, P. S. (1982) Smectic-AOrder at the Surface of a Nematic Liquid Crystal: Synchrotron X-Ray Diffraction. Physical Review Letters, 48 (16). 1107-1110 doi:10.1103/physrevlett.48.1107
Braslau, A., Deutsch, M., Pershan, P. S., Weiss, A. H., Als-Nielsen, J., Bohr, J. (1985) Surface Roughness of Water Measured by X-Ray Reflectivity. Physical Review Letters, 54 (2). 114-117 doi:10.1103/physrevlett.54.114
Pershan, P. S., Braslau, A., Weiss, A. H., Als-Nielsen, J. (1987) Smectic layering at the free surface of liquid crystals in the nematic phase: X-ray reflectivity. Physical Review A, 35 (11). 4800-4813 doi:10.1103/physreva.35.4800
Schwartz, D. K., Braslau, A., Ocko, B., Pershan, P. S., Als-Nielsen, J., Huang, J. S. (1988) X-ray reflectivity studies of a microemulsion surface. Physical Review A, 38 (11). 5817-5824 doi:10.1103/physreva.38.5817
Braslau, A., Pershan, P. S., Swislow, G., Ocko, B. M., Als-Nielsen, J. (1988) Capillary waves on the surface of simple liquids measured by x-ray reflectivity. Physical Review A, 38 (5). 2457-2470 doi:10.1103/physreva.38.2457
Fukuto, M., Heilmann, R. K., Pershan, P. S., Griffiths, J. A., Yu, S. M., Tirrell, D. A. (1998) X-Ray Measurements of Noncapillary Spatial Fluctuations from a Liquid Surface. Physical Review Letters, 81 (16). 3455-3458 doi:10.1103/physrevlett.81.3455
Ocko, B. M., Braslau, A., Pershan, P. S., Als-Nielsen, J., Deutsch, M. (1986) Quantized Layer Growth at Liquid-Crystal Surfaces. Physical Review Letters, 57 (7). 923 doi:10.1103/physrevlett.57.923.5
Ocko, B. M., Braslau, A., Pershan, P. S., Als-Nielsen, J., Deutsch, M. (1986) Quantized layer growth at liquid-crystal surfaces. Physical Review Letters, 57 (1). 94-97 doi:10.1103/physrevlett.57.94
Magnussen, O. M., Ocko, B. M., Regan, M. J., Penanen, K., Pershan, P. S., Deutsch, M. (1995) X-Ray Reflectivity Measurements of Surface Layering in Liquid Mercury. Physical Review Letters, 74 (22). 4444-4447 doi:10.1103/physrevlett.74.4444
Collett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (24). 2190 doi:10.1103/physrevlett.52.2190.2
Collett, Jeffrey, Pershan, P. S., Sirota, Eric B., Sorensen, L. B. (1984) Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films. Physical Review Letters, 52 (5). 356-359 doi:10.1103/physrevlett.52.356
 
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