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Hoeven, A. J., Lenssinck, J. M., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1989) Scanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy. Physical Review Letters, 63 (17). 1830-1832 doi:10.1103/physrevlett.63.1830

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Reference TypeJournal (article/letter/editorial)
TitleScanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy
JournalPhysical Review Letters
AuthorsHoeven, A. J.Author
Lenssinck, J. M.Author
Dijkkamp, D.Author
van Loenen, E. J.Author
Dieleman, J.Author
Year1989 (October 23)Volume63
Issue17
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.63.1830Search in ResearchGate
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Mindat Ref. ID10551473Long-form Identifiermindat:1:5:10551473:4
GUID0
Full ReferenceHoeven, A. J., Lenssinck, J. M., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1989) Scanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy. Physical Review Letters, 63 (17). 1830-1832 doi:10.1103/physrevlett.63.1830
Plain TextHoeven, A. J., Lenssinck, J. M., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1989) Scanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy. Physical Review Letters, 63 (17). 1830-1832 doi:10.1103/physrevlett.63.1830
In(1989, October) Physical Review Letters Vol. 63 (17) American Physical Society (APS)

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Dijkkamp, D., Hoeven, A. J., van Loenen, E. J., Lenssinck, J. M., Dieleman, J. (1990) Morphology and distribution of atomic steps on Si (001) studied with scanning tunneling microscopy. Applied Physics Letters, 56 (1). 39-41 doi:10.1063/1.102640
van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1989) Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters, 55 (13). 1312-1314 doi:10.1063/1.101641
van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1990) Evidence for tip imaging in scanning tunneling microscopy. Applied Physics Letters, 56 (18). 1755-1757 doi:10.1063/1.103090
Zandvliet, H. J. W., Elswijk, H. B., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1991) On the period of reflection high‐energy electron diffraction intensity oscillations during Si molecular‐beam epitaxy on vicinal Si(001). Journal of Applied Physics, 70 (5). 2614-2617 doi:10.1063/1.349372
Elswijk, H. B., Dijkkamp, D., van Loenen, E. J. (1991) Geometric and electronic structure of Sb on Si(111) by scanning tunneling microscopy. Physical Review B, 44 (8) 3802-3809 doi:10.1103/physrevb.44.3802
Hoeven, A.J., Dijkkamp, D., Van Loenen, E.J., Van Hooft, P.J.G.M. (1989) A scanning tunneling microscope study of the Si(110) surface. Surface Science Letters, 211. doi:10.1016/0167-2584(89)90315-0
Hoeven, A.J., Dijkkamp, D., Van Loenen, E.J., Van Hooft, P.J.G.M. (1989) A scanning tunneling microscope study of the Si(110) surface. Surface Science, 211. 165-172 doi:10.1016/0039-6028(89)90767-x
Loenen, E. J., Dijkkamp, D., Hoeven, A. J. (1988) Clean and metal-contaminated Si(110) surfaces studied by RHEED, XPS and STM. Journal of Microscopy, 152 (2). 487-496 doi:10.1111/j.1365-2818.1988.tb01412.x
Pashley, M. D., Haberern, K. W., Gaines, J. M. (1991) Scanning tunneling microscopy comparison of GaAs(001) vicinal surfaces grown by molecular beam epitaxy. Applied Physics Letters, 58 (4). 406-408 doi:10.1063/1.104649
Hoeven, A. J., van Loenen, E. J., van Hooft, P. J. G. M., Oostveen, K. (1990) A multiprocessor data acquisition and analysis system for scanning tunneling microscopy. Review of Scientific Instruments, 61 (6). 1668-1673 doi:10.1063/1.1141130
Zandvliet, H. J. W., Elswijk, H. B., van Loenen, E. J., Dijkkamp, D. (1992) Equilibrium structure of monatomic steps on vicinal Si(001) Physical Review B, 45 (11) 5965-5968 doi:10.1103/physrevb.45.5965
 
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