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van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1989) Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters, 55 (13). 1312-1314 doi:10.1063/1.101641

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Reference TypeJournal (article/letter/editorial)
TitleDirect writing in Si with a scanning tunneling microscope
JournalApplied Physics Letters
Authorsvan Loenen, E. J.Author
Dijkkamp, D.Author
Hoeven, A. J.Author
Lenssinck, J. M.Author
Dieleman, J.Author
Year1989 (September 25)Volume55
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.101641Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8487965Long-form Identifiermindat:1:5:8487965:3
GUID0
Full Referencevan Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1989) Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters, 55 (13). 1312-1314 doi:10.1063/1.101641
Plain Textvan Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1989) Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters, 55 (13). 1312-1314 doi:10.1063/1.101641
In(1989, September) Applied Physics Letters Vol. 55 (13) AIP Publishing

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van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1990) Evidence for tip imaging in scanning tunneling microscopy. Applied Physics Letters, 56 (18). 1755-1757 doi:10.1063/1.103090
Dijkkamp, D., Hoeven, A. J., van Loenen, E. J., Lenssinck, J. M., Dieleman, J. (1990) Morphology and distribution of atomic steps on Si (001) studied with scanning tunneling microscopy. Applied Physics Letters, 56 (1). 39-41 doi:10.1063/1.102640
Hoeven, A. J., Lenssinck, J. M., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1989) Scanning-tunneling-microscopy study of single-domain Si(001) surfaces grown by molecular-beam epitaxy. Physical Review Letters, 63 (17). 1830-1832 doi:10.1103/physrevlett.63.1830
Hoeven, A.J., Dijkkamp, D., Van Loenen, E.J., Van Hooft, P.J.G.M. (1989) A scanning tunneling microscope study of the Si(110) surface. Surface Science Letters, 211. doi:10.1016/0167-2584(89)90315-0
Hoeven, A.J., Dijkkamp, D., Van Loenen, E.J., Van Hooft, P.J.G.M. (1989) A scanning tunneling microscope study of the Si(110) surface. Surface Science, 211. 165-172 doi:10.1016/0039-6028(89)90767-x
Kordić, S., van Loenen, E. J., Walker, A. J. (1991) Current imaging of cleaved siliconpnjunctions with an ultrahigh vacuum scanning tunneling microscope. Applied Physics Letters, 59 (24). 3154-3156 doi:10.1063/1.105769
Zandvliet, H. J. W., Elswijk, H. B., Dijkkamp, D., van Loenen, E. J., Dieleman, J. (1991) On the period of reflection high‐energy electron diffraction intensity oscillations during Si molecular‐beam epitaxy on vicinal Si(001). Journal of Applied Physics, 70 (5). 2614-2617 doi:10.1063/1.349372
Hoeven, A. J., van Loenen, E. J., van Hooft, P. J. G. M., Oostveen, K. (1990) A multiprocessor data acquisition and analysis system for scanning tunneling microscopy. Review of Scientific Instruments, 61 (6). 1668-1673 doi:10.1063/1.1141130
Elswijk, H. B., Dijkkamp, D., van Loenen, E. J. (1991) Geometric and electronic structure of Sb on Si(111) by scanning tunneling microscopy. Physical Review B, 44 (8) 3802-3809 doi:10.1103/physrevb.44.3802
Loenen, E. J., Dijkkamp, D., Hoeven, A. J. (1988) Clean and metal-contaminated Si(110) surfaces studied by RHEED, XPS and STM. Journal of Microscopy, 152 (2). 487-496 doi:10.1111/j.1365-2818.1988.tb01412.x
Silver, R. M., Ehrichs, E. E., de Lozanne, A. L. (1987) Direct writing of submicron metallic features with a scanning tunneling microscope. Applied Physics Letters, 51 (4). 247-249 doi:10.1063/1.98462
 
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