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Silver, R. M., Ehrichs, E. E., de Lozanne, A. L. (1987) Direct writing of submicron metallic features with a scanning tunneling microscope. Applied Physics Letters, 51 (4). 247-249 doi:10.1063/1.98462

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Reference TypeJournal (article/letter/editorial)
TitleDirect writing of submicron metallic features with a scanning tunneling microscope
JournalApplied Physics Letters
AuthorsSilver, R. M.Author
Ehrichs, E. E.Author
de Lozanne, A. L.Author
Year1987 (July 27)Volume51
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.98462Search in ResearchGate
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Mindat Ref. ID8482013Long-form Identifiermindat:1:5:8482013:4
GUID0
Full ReferenceSilver, R. M., Ehrichs, E. E., de Lozanne, A. L. (1987) Direct writing of submicron metallic features with a scanning tunneling microscope. Applied Physics Letters, 51 (4). 247-249 doi:10.1063/1.98462
Plain TextSilver, R. M., Ehrichs, E. E., de Lozanne, A. L. (1987) Direct writing of submicron metallic features with a scanning tunneling microscope. Applied Physics Letters, 51 (4). 247-249 doi:10.1063/1.98462
In(1987, July) Applied Physics Letters Vol. 51 (4) AIP Publishing

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Ehrichs, E. E., Yoon, S., de Lozanne, A. L. (1988) Direct writing of 10 nm features with the scanning tunneling microscope. Applied Physics Letters, 53 (23). 2287-2289 doi:10.1063/1.100255
Lozanne, A L de, Ehrichs, E E, Smith, W F (1993) Nanofabrication of nickel wires with the scanning tunnelling microscope. Journal of Physics: Condensed Matter, 5 (33). doi:10.1088/0953-8984/5/33a/154
Ehrichs, E.E., Smith, W.F., de Lozanne, A.L. (1992) Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope system. Ultramicroscopy, 42. 1438-1442 doi:10.1016/0304-3991(92)90462-s
Silver, R. M., Talvacchio, J., de Lozanne, A. L. (1987) Sputter deposition of YBa2Cu3O7−ythin films. Applied Physics Letters, 51 (25). 2149-2151 doi:10.1063/1.98976
van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J. (1989) Direct writing in Si with a scanning tunneling microscope. Applied Physics Letters, 55 (13). 1312-1314 doi:10.1063/1.101641
Ng, K. W., Pan, S., Lozanne, A. L. de, Panson, A. J., Talvacchio, J. (1987) Tunneling Spectroscopy of HighTcOxide Superconductors with a Scanning Tunneling Microscope. Japanese Journal of Applied Physics, 26. 993 doi:10.7567/jjaps.26s3.993
Snyder, C. W., de Lozanne, A. L. (1988) Concentric tube scanning tunneling microscope. Review of Scientific Instruments, 59 (4). 541-544 doi:10.1063/1.1139883
Stahl, U., Yuan, C. W., de Lozanne, A. L., Tortonese, M. (1994) Atomic force microscope using piezoresistive cantilevers and combined with a scanning electron microscope. Applied Physics Letters, 65 (22). 2878-2880 doi:10.1063/1.113030
Baró, A. M., Bartolome, A., Vazquez, L., García, N., Reifenberger, R., Choi, E., Andres, R. P. (1987) Direct imaging of 13‐Å‐diam Au clusters using scanning tunneling microscopy. Applied Physics Letters, 51 (20). 1594-1596 doi:10.1063/1.98565
Hartmann, E., Behm, R. J., Krötz, G., Müller, G., Koch, F. (1991) Writing electronically active nanometer‐scale structures with a scanning tunneling microscope. Applied Physics Letters, 59 (17). 2136-2138 doi:10.1063/1.106104
Staufer, U., Wiesendanger, R., Eng, L., Rosenthaler, L., Hidber, H. R., Güntherodt, H.‐J., Garcia, N. (1987) Nanometer scale structure fabrication with the scanning tunneling microscope. Applied Physics Letters, 51 (4). 244-246 doi:10.1063/1.98461
 
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