Reference Type | Journal (article/letter/editorial) |
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Title | Asymmetry in surface morphology and dislocation nucleation of In1−xGaxAs/001) InP single heteroepitaxial layers |
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Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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Authors | Wagner, G. | Author |
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Paufler, P. | Author |
Rohde, G. | Author |
Year | 1989 (January 1) | Volume | 189 |
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Issue | 3-4 |
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Publisher | Walter de Gruyter GmbH |
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DOI | doi:10.1524/zkri.1989.189.3-4.269Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 111941 | Long-form Identifier | mindat:1:5:111941:5 |
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GUID | 0 |
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Full Reference | Wagner, G., Paufler, P., Rohde, G. (1989) Asymmetry in surface morphology and dislocation nucleation of In1−xGaxAs/001) InP single heteroepitaxial layers. Zeitschrift für Kristallographie - Crystalline Materials, 189 (3-4) 269 doi:10.1524/zkri.1989.189.3-4.269 |
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Plain Text | Wagner, G., Paufler, P., Rohde, G. (1989) Asymmetry in surface morphology and dislocation nucleation of In1−xGaxAs/001) InP single heteroepitaxial layers. Zeitschrift für Kristallographie - Crystalline Materials, 189 (3-4) 269 doi:10.1524/zkri.1989.189.3-4.269 |
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In | (1989, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 189 (3-4) Walter de Gruyter GmbH |
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Abstract/Notes | AbstractThe surface morphology and the dislocation structure of MOCVD grown In |
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