Reference Type | Journal (article/letter/editorial) |
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Title | Surface corrugations on strained In1-xGaxAs epitaxial layers due to multiplex slip |
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Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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Authors | Paufler, Peter | Author |
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Wagner, Gerald | Author |
Year | 1990 (January 1) | Volume | 191 |
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Issue | 3-4 |
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Publisher | Walter de Gruyter GmbH |
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DOI | doi:10.1524/zkri.1990.191.3-4.265Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 112110 | Long-form Identifier | mindat:1:5:112110:4 |
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GUID | 0 |
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Full Reference | Paufler, Peter, Wagner, Gerald (1990) Surface corrugations on strained In1-xGaxAs epitaxial layers due to multiplex slip. Zeitschrift für Kristallographie - Crystalline Materials, 191 (3-4) 265 doi:10.1524/zkri.1990.191.3-4.265 |
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Plain Text | Paufler, Peter, Wagner, Gerald (1990) Surface corrugations on strained In1-xGaxAs epitaxial layers due to multiplex slip. Zeitschrift für Kristallographie - Crystalline Materials, 191 (3-4) 265 doi:10.1524/zkri.1990.191.3-4.265 |
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In | (1990, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 191 (3-4) Walter de Gruyter GmbH |
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Abstract/Notes | AbstractAn investigation of the surface profile of epitaxial In |
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