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Nakamura, Hatsuo, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Watabe, Hirokuni (1992) Soft X-Ray Spectroscopic Analysis of Ni-Silicides. Journal of the Physical Society of Japan, 61 (2). 616-620 doi:10.1143/jpsj.61.616

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Reference TypeJournal (article/letter/editorial)
TitleSoft X-Ray Spectroscopic Analysis of Ni-Silicides
JournalJournal of the Physical Society of Japan
AuthorsNakamura, HatsuoAuthor
Hirai, MasaakiAuthor
Kusaka, MasahikoAuthor
Iwami, MotohiroAuthor
Watabe, HirokuniAuthor
Year1992 (February 15)Volume61
Issue2
PublisherPhysical Society of Japan
DOIdoi:10.1143/jpsj.61.616Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11203574Long-form Identifiermindat:1:5:11203574:1
GUID0
Full ReferenceNakamura, Hatsuo, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Watabe, Hirokuni (1992) Soft X-Ray Spectroscopic Analysis of Ni-Silicides. Journal of the Physical Society of Japan, 61 (2). 616-620 doi:10.1143/jpsj.61.616
Plain TextNakamura, Hatsuo, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Watabe, Hirokuni (1992) Soft X-Ray Spectroscopic Analysis of Ni-Silicides. Journal of the Physical Society of Japan, 61 (2). 616-620 doi:10.1143/jpsj.61.616
In(1992, February) Journal of the Physical Society of Japan Vol. 61 (2) Physical Society of Japan

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Kasaya, Megumi, Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Watabe, Hirokuni (1994) Valence Band Density of States of the Iron Silicides Studied by Soft X-Ray Emission Spectroscopy. Journal of the Physical Society of Japan, 63 (11). 4097-4101 doi:10.1143/jpsj.63.4097
Kawamoto, Satoshi, Hirai, Masaaki, Kusaka, Masahiko, Nakamura, Hatsuo, Iwami, Motohiro, Watabe, Hirokuni (1993) Valence Band Density of States of Palladium Silicides Studied by X-Ray Emission Spectroscopy (XES) Japanese Journal of Applied Physics, 32. doi:10.1143/jjap.32.l597
Watabe, Hirokuni, Iwami, Motohiro, Hirai, Masaaki, Kusaka, Masahiko, Nakamura, Hatsuo (1991) Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy. Japanese Journal of Applied Physics, 30. 1928-1930 doi:10.1143/jjap.30.1928
Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Ohshima, Hisayoshi, Hattori, Tadashi (1994) Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides ($\bf Pt_{2}Si$, PtSi) Japanese Journal of Applied Physics, 33. doi:10.1143/jjap.33.l1012
Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Minomura, Shigeru, Watabe, Hirokuni, Kawai, Masao, Soezima, Hiroyoshi (1992) Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method. Japanese Journal of Applied Physics, 31. 395-400 doi:10.1143/jjap.31.395
Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Yokota, Yasuhiro, Akiyama, Akitsugu, Watabe, Hirokuni (1993) Ni-Silicide Formation: Dependence on Crystallographic Orientation of Si Substrates. Japanese Journal of Applied Physics, 32. 3237-3246 doi:10.1143/jjap.32.3237
Wang, Jinliang, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (1998) Valence Band Density of States of the Manganese Silicides Studied by Soft X-Ray Emission Spectroscopy. Journal of the Physical Society of Japan, 67 (1). 230-233 doi:10.1143/jpsj.67.230
Wang, Jinliang, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Morii, Takashi, Watabe, Hirokuni (1999) Mn(Thin-Film)/Si(Substrate) Contacts: Analysis of the Buried Interface by Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 38. 198-200 doi:10.1143/jjap.38.198
Iwami, Motohiro, Hirai, Masaaki, Kusaka, Masahiko, Kubota, Masaru, Yamamoto, Sekika, Nakamura, Hatsuo, Watabe, Hirokuni, Kawai, Masao, Soezima, Hiroyoshi (1990) Construction of a Soft X-Ray Emission Spectroscopy (SXES) Apparatus and Its Application for Study of Electronic and Atomic Structures of a Multilayer System. Japanese Journal of Applied Physics, 29. 1353-1356 doi:10.1143/jjap.29.1353
Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Murakami, Eiichi, Nakagawa, Kiyokazu (1991) Nondestructive Observation of Si0.5Ge0.5/Ge/Si1-xGexHeterostructure Using Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1653
Zhou, Nansheng, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo (1990) Valence Band Electronic State of Transition-Metal Silicide TiSi2Studied by Soft X-Ray Emission Spectroscopy (SXES) Japanese Journal of Applied Physics, 29. 2014-2016 doi:10.1143/jjap.29.2014
 
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