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Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Murakami, Eiichi, Nakagawa, Kiyokazu (1991) Nondestructive Observation of Si0.5Ge0.5/Ge/Si1-xGexHeterostructure Using Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1653

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Reference TypeJournal (article/letter/editorial)
TitleNondestructive Observation of Si0.5Ge0.5/Ge/Si1-xGexHeterostructure Using Soft X-Ray Emission Spectroscopy
JournalJapanese Journal of Applied Physics
AuthorsHirai, MasaakiAuthor
Kusaka, MasahikoAuthor
Iwami, MotohiroAuthor
Nakamura, HatsuoAuthor
Murakami, EiichiAuthor
Nakagawa, KiyokazuAuthor
Year1991 (September 15)Volume30
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.30.l1653Search in ResearchGate
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Mindat Ref. ID14996851Long-form Identifiermindat:1:5:14996851:7
GUID0
Full ReferenceHirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Murakami, Eiichi, Nakagawa, Kiyokazu (1991) Nondestructive Observation of Si0.5Ge0.5/Ge/Si1-xGexHeterostructure Using Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1653
Plain TextHirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Murakami, Eiichi, Nakagawa, Kiyokazu (1991) Nondestructive Observation of Si0.5Ge0.5/Ge/Si1-xGexHeterostructure Using Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1653
In(1991) Japanese Journal of Applied Physics Vol. 30. Japan Society of Applied Physics

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Watabe, Hirokuni, Iwami, Motohiro, Hirai, Masaaki, Kusaka, Masahiko, Nakamura, Hatsuo (1991) Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy. Japanese Journal of Applied Physics, 30. 1928-1930 doi:10.1143/jjap.30.1928
Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Minomura, Shigeru, Watabe, Hirokuni, Kawai, Masao, Soezima, Hiroyoshi (1992) Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method. Japanese Journal of Applied Physics, 31. 395-400 doi:10.1143/jjap.31.395
Etoh, Hiroyuki, Murakami, Eiichi, Nishida, Akio, Nakagawa, Kiyokazu, Miyao, Masanobu (1991) Influence of Strain on Electrical Properties of the Ge Channel in the Modulation-Doped p-Si0.5Ge0.5/Ge/Si1-xGexHeterostructure. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l163
Zhou, Nansheng, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo (1990) Valence Band Electronic State of Transition-Metal Silicide TiSi2Studied by Soft X-Ray Emission Spectroscopy (SXES) Japanese Journal of Applied Physics, 29. 2014-2016 doi:10.1143/jjap.29.2014
Heck, Claire, Kusaka, Masahiko, Hirai, Masaaki, Iwami, Motohiro, Nakamura, Hatsuo (1994) Study of Cr Silicide Formation on Si(100) Due to Solid-Phase Reaction Using Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 33. 6667-6670 doi:10.1143/jjap.33.6667
Yamauchi, Shoichi, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Nakamura, Hatsuo, Ohshima, Hisayoshi, Hattori, Tadashi (1994) Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides ($\bf Pt_{2}Si$, PtSi) Japanese Journal of Applied Physics, 33. doi:10.1143/jjap.33.l1012
Kawamoto, Satoshi, Hirai, Masaaki, Kusaka, Masahiko, Nakamura, Hatsuo, Iwami, Motohiro, Watabe, Hirokuni (1993) Valence Band Density of States of Palladium Silicides Studied by X-Ray Emission Spectroscopy (XES) Japanese Journal of Applied Physics, 32. doi:10.1143/jjap.32.l597
Iwami, Motohiro, Nakamura, Hatsuo, Hirai, Masaaki, Kusaka, Masahiko, Azuma, Yuhko, Akao, Fumio (1990) Contribution of the SisElectronic State to the Density of State of CoSi2at Fermi Energy by Soft X-Ray Emission Spectroscopy. Japanese Journal of Applied Physics, 29. doi:10.1143/jjap.29.l470
Iwami, Motohiro, Hirai, Masaaki, Kusaka, Masahiko, Kubota, Masaru, Yamamoto, Sekika, Nakamura, Hatsuo, Watabe, Hirokuni, Kawai, Masao, Soezima, Hiroyoshi (1990) Construction of a Soft X-Ray Emission Spectroscopy (SXES) Apparatus and Its Application for Study of Electronic and Atomic Structures of a Multilayer System. Japanese Journal of Applied Physics, 29. 1353-1356 doi:10.1143/jjap.29.1353
Kinoshita, Akimasa, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro (1999) Application of Monte Carlo Simulation to Structural Analysis by Soft X-Ray Emission Spectroscopy for a Silicide/Si-Bulk System. Japanese Journal of Applied Physics, 38. 6544-6548 doi:10.1143/jjap.38.6544
Nakamura, Hatsuo, Hirai, Masaaki, Kusaka, Masahiko, Iwami, Motohiro, Watabe, Hirokuni (1992) Soft X-Ray Spectroscopic Analysis of Ni-Silicides. Journal of the Physical Society of Japan, 61 (2). 616-620 doi:10.1143/jpsj.61.616
 
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