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Kim, Seung Hwan, Kim, Kyong Hon, Lee, Seoung Hun, Lee, Sukmock, Lee, Min Hee, Lee, El-Hang (2008) White-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method. Journal of the Korean Physical Society, 53 (6). 3201-3206 doi:10.3938/jkps.53.3201

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Reference TypeJournal (article/letter/editorial)
TitleWhite-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method
JournalJournal of the Korean Physical Society
AuthorsKim, Seung HwanAuthor
Kim, Kyong HonAuthor
Lee, Seoung HunAuthor
Lee, SukmockAuthor
Lee, Min HeeAuthor
Lee, El-HangAuthor
Year2008 (December 15)Volume53
Issue6
PublisherKorean Physical Society
DOIdoi:10.3938/jkps.53.3201Search in ResearchGate
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Mindat Ref. ID11234071Long-form Identifiermindat:1:5:11234071:5
GUID0
Full ReferenceKim, Seung Hwan, Kim, Kyong Hon, Lee, Seoung Hun, Lee, Sukmock, Lee, Min Hee, Lee, El-Hang (2008) White-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method. Journal of the Korean Physical Society, 53 (6). 3201-3206 doi:10.3938/jkps.53.3201
Plain TextKim, Seung Hwan, Kim, Kyong Hon, Lee, Seoung Hun, Lee, Sukmock, Lee, Min Hee, Lee, El-Hang (2008) White-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method. Journal of the Korean Physical Society, 53 (6). 3201-3206 doi:10.3938/jkps.53.3201
In(2008, December) Journal of the Korean Physical Society Vol. 53 (6) Korean Physical Society

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Kim, Seung Hwan, Lee, Seoung Hun, Lim, Jae In, Kim, Kyong Hon (2010) Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry. Applied Optics, 49. 910pp. doi:10.1364/ao.49.000910
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