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Kim, Seung Hwan, Lee, Seoung Hun, Lim, Jae In, Kim, Kyong Hon (2010) Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry. Applied Optics, 49. 910pp. doi:10.1364/ao.49.000910

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Reference TypeJournal (article/letter/editorial)
TitleAbsolute refractive index measurement method over a broad wavelength region based on white-light interferometry
JournalApplied Optics
AuthorsKim, Seung HwanAuthor
Lee, Seoung HunAuthor
Lim, Jae InAuthor
Kim, Kyong HonAuthor
Year2010 (February 10)Volume49
PublisherThe Optical Society
DOIdoi:10.1364/ao.49.000910Search in ResearchGate
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Mindat Ref. ID11970110Long-form Identifiermindat:1:5:11970110:6
GUID0
Full ReferenceKim, Seung Hwan, Lee, Seoung Hun, Lim, Jae In, Kim, Kyong Hon (2010) Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry. Applied Optics, 49. 910pp. doi:10.1364/ao.49.000910
Plain TextKim, Seung Hwan, Lee, Seoung Hun, Lim, Jae In, Kim, Kyong Hon (2010) Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry. Applied Optics, 49. 910pp. doi:10.1364/ao.49.000910
In(n.d.) Applied Optics Vol. 49. The Optical Society

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Yun, Hyo Geun, Kim, Seung Hwan, Jeong, Heung Sun, Kim, Kyong Hon (2012) Rotation angle measurement based on white-light interferometry with a standard optical flat. Applied Optics, 51. 720pp. doi:10.1364/ao.51.000720
Kim, Seung Hwan, Kim, Kyong Hon, Lee, Seoung Hun, Lee, Sukmock, Lee, Min Hee, Lee, El-Hang (2008) White-Light Interferometer Based on a High-Precision Chromatic Dispersion Measurement Method. Journal of the Korean Physical Society, 53 (6). 3201-3206 doi:10.3938/jkps.53.3201
Lee, Hak Kyu, Kim, Kyong Hon, Lee, El-Hang (1997) Measurement of the nonlinear refractive index of fibers with a rotating nonlinear Sagnac interferometer. Applied Optics, 36. 5893pp. doi:10.1364/ao.36.005893
Bang, David J., Kim, Yudeuk, Kim, Yoohan, Kim, Myung-Jik, Kim, Kyong Hon (2018) Simultaneous measurement of group and phase refractive indices and physical thickness of transparent plates with low coherence Fabry–Perot interferometry. Applied Optics, 57. 4428pp. doi:10.1364/ao.57.004428
Kim, Seung-Woo, Kim, Gee-Hong (1999) Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry. Applied Optics, 38. 5968pp. doi:10.1364/ao.38.005968
Lee, Seoung Hun, Jeong, Kyu Hyeon, Kim, Seung Hwan, Kim, Kyong Hon (2008) Rayleigh-Backscattering-Suppressed Two-Way Quantum Key Distribution. Journal of the Korean Physical Society, 52 (1). 5-10 doi:10.3938/jkps.52.5
Rhee, Hyug-Gyo, Kim, Seung-Woo (2002) Absolute distance measurement by two-point-diffraction interferometry. Applied Optics, 41. 5921pp. doi:10.1364/ao.41.005921
Tsogvoo, Khos-Ochir, Munkhbaatar, Purevdorj, Yang, Byung Kwan, Kim, Jin Seung, Myung-Whun, Kim (2014) Phase change measurement of birefringent optical devices with white light interferometry. Applied Optics, 53. 141pp. doi:10.1364/ao.53.000141
Galli, Matteo, Marabelli, Franco, Guizzetti, Giorgio (2003) Direct measurement of refractive-index dispersion of transparent media by white-light interferometry. Applied Optics, 42. 3910pp. doi:10.1364/ao.42.003910
Lim, Yongjun, Kim, Seyoon, Park, Junghyun, Kim, Hwi, Lee, Byoungho (2010) Analysis of the coupling of light into a metal-dielectric composite waveguide structure and its application for use as a wavelength-band selection filter. Applied Optics, 49. doi:10.1364/ao.49.000a23
Le Floch, Sébastien, Salvadé, Yves, Droz, Nathalie, Mitouassiwou, Rostand, Favre, Patrick (2010) Superheterodyne configuration for two-wavelength interferometry applied to absolute distance measurement. Applied Optics, 49. 714pp. doi:10.1364/ao.49.000714
 
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