Reference Type | Journal (article/letter/editorial) |
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Title | Investigation on the Drift of GaAs MESFET's by High Frequency Parameters |
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Journal | Japanese Journal of Applied Physics |
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Authors | Ohata, Keiichi | Author |
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Itoh, Hitoshi | Author |
Hasegawa, Fumio | Author |
Year | 1980 (January 1) | Volume | 19 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.7567/jjaps.19s1.357Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14983460 | Long-form Identifier | mindat:1:5:14983460:7 |
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GUID | 0 |
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Full Reference | Ohata, Keiichi, Itoh, Hitoshi, Hasegawa, Fumio (1980) Investigation on the Drift of GaAs MESFET's by High Frequency Parameters. Japanese Journal of Applied Physics, 19. 357 doi:10.7567/jjaps.19s1.357 |
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Plain Text | Ohata, Keiichi, Itoh, Hitoshi, Hasegawa, Fumio (1980) Investigation on the Drift of GaAs MESFET's by High Frequency Parameters. Japanese Journal of Applied Physics, 19. 357 doi:10.7567/jjaps.19s1.357 |
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In | (1980) Japanese Journal of Applied Physics Vol. 19. Japan Society of Applied Physics |
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