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Munakata, Chusuke, Nanba, Mitsuo, Matsubara, Sunao (1981) Non-Destructive Method of Observing Inhomogeneities in p-n Junctions with a Chopped Photon Beam. Japanese Journal of Applied Physics, 20 (2) doi:10.1143/jjap.20.l137

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Reference TypeJournal (article/letter/editorial)
TitleNon-Destructive Method of Observing Inhomogeneities in p-n Junctions with a Chopped Photon Beam
JournalJapanese Journal of Applied Physics
AuthorsMunakata, ChusukeAuthor
Nanba, MitsuoAuthor
Matsubara, SunaoAuthor
Year1981 (February)Volume20
Issue2
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.20.l137Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14984834Long-form Identifiermindat:1:5:14984834:5
GUID0
Full ReferenceMunakata, Chusuke, Nanba, Mitsuo, Matsubara, Sunao (1981) Non-Destructive Method of Observing Inhomogeneities in p-n Junctions with a Chopped Photon Beam. Japanese Journal of Applied Physics, 20 (2) doi:10.1143/jjap.20.l137
Plain TextMunakata, Chusuke, Nanba, Mitsuo, Matsubara, Sunao (1981) Non-Destructive Method of Observing Inhomogeneities in p-n Junctions with a Chopped Photon Beam. Japanese Journal of Applied Physics, 20 (2) doi:10.1143/jjap.20.l137
In(1981, February) Japanese Journal of Applied Physics Vol. 20 (2) Japan Society of Applied Physics

See Also

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Munakata, Chusuke, Yagi, Kunihiro, Warabisako, Terunori, Nanba, Mitsuo, Matsubara, Sunao (1982) Observation of p-n Junctions with a Flying-Spot Scanner Using a Chopped Photon Beam. Japanese Journal of Applied Physics, 21. 624-632 doi:10.1143/jjap.21.624
Munakata, Chusuke, Honma, Noriaki (1981) Non-Destructive Method for Measuring Cut-Off Frequency of a p-n Junction with a Chopped Photon Beam. Japanese Journal of Applied Physics, 20 (12) doi:10.1143/jjap.20.l856
Munakata, Chusuke, Miyazaki, Masaru (1981) A Novel Method of Electron Beam Recording on a Si Wafer. Japanese Journal of Applied Physics, 20 (4) doi:10.1143/jjap.20.l293
Munakata, Chusuke (1967) An Electron Beam Method of Measuring Deffusion Voltage in Semiconductors. Japanese Journal of Applied Physics, 6 (2) 274 doi:10.1143/jjap.6.274
Munakata, Chusuke, Honma, Noriaki, Itoh, Haruo (1983) A Non-Destructive Method for Measuring Lifetimes for Minority Carriers in Semiconductor Wafers Using Frequency-Dependent ac Photovoltages. Japanese Journal of Applied Physics, 22. doi:10.1143/jjap.22.l103
Munakata, Chusuke (1967) An Electron Beam Method of Measuring Resistivity Distribution in Semiconductors. Japanese Journal of Applied Physics, 6 (8) 963-971 doi:10.1143/jjap.6.963
Munakata, Chusuke (1966) Detection of Resistivity Striations in a Ge Crystal with an Electron Beam. Japanese Journal of Applied Physics, 5 (4) 336 doi:10.1143/jjap.5.336
Munakata, Chusuke (1965) Measurement of the Homogenity of a Semiconductor with an Electron Beam. Japanese Journal of Applied Physics, 4 (10) 815 doi:10.1143/jjap.4.815
Munakata, Chusuke (1967) Measurement of Potential Distribution in a Semiconductor Crystal with an Electron Beam. Japanese Journal of Applied Physics, 6 (4) 548-549 doi:10.1143/jjap.6.548
Munakata, Chusuke (1972) Analysis of the β-Conductive Signal Excited with a Pulsed Electron Beam. Japanese Journal of Applied Physics, 11 (9) 1333-1337 doi:10.1143/jjap.11.1333
Munakata, Chusuke, Todokoro, Hideo (1966) A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium. Japanese Journal of Applied Physics, 5 (3) 249 doi:10.1143/jjap.5.249
 
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