Banno, Naoki, Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Okamoto, Koichiro, Hada, Hiromitsu, Aono, Masakazu (2011) ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device. Japanese Journal of Applied Physics, 50 (7) 74201 doi:10.1143/jjap.50.074201
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Banno, Naoki | Author | |
| Sakamoto, Toshitsugu | Author | ||
| Tada, Munehiro | Author | ||
| Miyamura, Makoto | Author | ||
| Okamoto, Koichiro | Author | ||
| Hada, Hiromitsu | Author | ||
| Aono, Masakazu | Author | ||
| Year | 2011 (July 20) | Volume | 50 |
| Issue | 7 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.50.074201Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15038862 | Long-form Identifier | mindat:1:5:15038862:5 |
| GUID | 0 | ||
| Full Reference | Banno, Naoki, Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Okamoto, Koichiro, Hada, Hiromitsu, Aono, Masakazu (2011) ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device. Japanese Journal of Applied Physics, 50 (7) 74201 doi:10.1143/jjap.50.074201 | ||
| Plain Text | Banno, Naoki, Sakamoto, Toshitsugu, Tada, Munehiro, Miyamura, Makoto, Okamoto, Koichiro, Hada, Hiromitsu, Aono, Masakazu (2011) ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device. Japanese Journal of Applied Physics, 50 (7) 74201 doi:10.1143/jjap.50.074201 | ||
| In | (2011, July) Japanese Journal of Applied Physics Vol. 50 (7) Japan Society of Applied Physics | ||
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