(2022) Ultramicroscopy Vol. 240. Elsevier BV

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Reference Type	Journal (volume)
Journal	Ultramicroscopy	ISSN	0304-3991
Year	2022	Volume	< 240 >
Publisher	Elsevier BV
Mindat Ref. ID	15207467	Long-form Identifier	mindat:1:5:15207467:0
GUID	0
Full Reference	(2022) Ultramicroscopy Vol. 240. Elsevier BV
Plain Text	(2022) Ultramicroscopy Vol. 240. Elsevier BV
In	Elsevier BV (1975 - ) Ultramicroscopy

Contains

	Firoozabadi, S., Kükelhan, P., Beyer, A., Lehr, J., Heimes, D., Volz, K. (2022) Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM. Ultramicroscopy, 240. 113550 doi:10.1016/j.ultramic.2022.113550
	Huang, Siyuan, Li, Hai, Jin, Chuanhong, Li, Xinghua, Wang, Jianglin, Cai, Xin, Han, Yu, Lin, Fang (2022) Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope. Ultramicroscopy, 240. 113560 doi:10.1016/j.ultramic.2022.113560
	Bitrus, Samuel, Fitzek, Harald, Rigger, Eugen, Rattenberger, Johannes, Entner, Doris (2022) Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection. Ultramicroscopy, 240. 113567 doi:10.1016/j.ultramic.2022.113567
	Jannis, D., Velazco, A., Béché, A., Verbeeck, J. (2022) Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process. Ultramicroscopy, 240. 113568 doi:10.1016/j.ultramic.2022.113568
	Basha, Adham, Levi, George, Amrani, Tamir, Li, Yang, Ankonina, Guy, Shekhter, Pini, Kornblum, Lior, Goldfarb, Ilan, Kohn, Amit (2022) Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides. Ultramicroscopy, 240. 113570 doi:10.1016/j.ultramic.2022.113570
	Haruta, Mitsutaka, Kikkawa, Jun, Kimoto, Koji, Kurata, Hiroki (2022) Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments. Ultramicroscopy, 240. 113577 doi:10.1016/j.ultramic.2022.113577
	*Ederer, Manuel, Löffler, Stefan (2022) Image difference metrics for high-resolution electron microscopy. Ultramicroscopy, 240. 113578 doi:10.1016/j.ultramic.2022.113578*
	Bultema, Lindsey A., Bücker, Robert, Schulz, Eike C., Tellkamp, Friedjof, Gonschior, Josef, Miller, R.J. Dwayne, Kassier, Günther H. (2022) The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias. Ultramicroscopy, 240. 113579 doi:10.1016/j.ultramic.2022.113579
	Seki, Takehito, Khare, Kushagra, Murakami, Yoshiki O., Toyama, Satoko, Sánchez-Santolino, Gabriel, Sasaki, Hirokazu, Findlay, Scott D., Petersen, Timothy C., Ikuhara, Yuichi, Shibata, Naoya (2022) Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy. Ultramicroscopy, 240. 113580 doi:10.1016/j.ultramic.2022.113580
	Jeon, Dohyeon, Kim, Haesol, Gu, Minji, Kim, Taekyeong (2022) Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy. Ultramicroscopy, 240. 113590 doi:10.1016/j.ultramic.2022.113590
	Zhao, Jiangtao, Xu, Wenhui, Yi, Jianji, Wang, Bingyang, Zhang, Fucai (2022) Extended coherent modulation imaging for single-shot object retrieval free from illumination artifacts. Ultramicroscopy, 240. 113591 doi:10.1016/j.ultramic.2022.113591
	Kunnas, Peter, Moradi, Mohammad-Amin, Sommerdijk, Nico, de Jonge, Niels (2022) Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy. Ultramicroscopy, 240. 113596 doi:10.1016/j.ultramic.2022.113596
	*Shafiei, Farbod, Downer, Michael C. (2022) Collection of propagating electromagnetic fields by uncoated probe. Ultramicroscopy, 240. 113597 doi:10.1016/j.ultramic.2022.113597*
	Chiodini, Stefano, Dinelli, Franco, Martinez, Nicolas F., Donati, Stefano, Albonetti, Cristiano (2022) Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy. Ultramicroscopy, 240. 113598 doi:10.1016/j.ultramic.2022.113598
	*(2022) Editorial Board. Ultramicroscopy, 240. 113605 doi:10.1016/s0304-3991(22)00125-5*

	*(2022) Ultramicroscopy* Vol. 237. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 236. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 235. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 234. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 233. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 232. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 242. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 241. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 239. Elsevier BV**
	*(2022) Ultramicroscopy* Vol. 238. Elsevier BV**
	*(2022) Talanta* Vol. 240. Elsevier BV**

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(2022) Ultramicroscopy Vol. 240. Elsevier BV

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