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Jannis, D., Velazco, A., Béché, A., Verbeeck, J. (2022) Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process. Ultramicroscopy, 240. 113568 doi:10.1016/j.ultramic.2022.113568

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Reference TypeJournal (article/letter/editorial)
TitleReducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process
JournalUltramicroscopy
AuthorsJannis, D.Author
Velazco, A.Author
Béché, A.Author
Verbeeck, J.Author
Year2022 (October)Volume240
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2022.113568Search in ResearchGate
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Mindat Ref. ID15207480Long-form Identifiermindat:1:5:15207480:9
GUID0
Full ReferenceJannis, D., Velazco, A., Béché, A., Verbeeck, J. (2022) Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process. Ultramicroscopy, 240. 113568 doi:10.1016/j.ultramic.2022.113568
Plain TextJannis, D., Velazco, A., Béché, A., Verbeeck, J. (2022) Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process. Ultramicroscopy, 240. 113568 doi:10.1016/j.ultramic.2022.113568
In(2022) Ultramicroscopy Vol. 240. Elsevier BV

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Velazco, A., Béché, A., Jannis, D., Verbeeck, J. (2022) Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings. Ultramicroscopy, 232. 113398pp. doi:10.1016/j.ultramic.2021.113398
Velazco, A., Nord, M., Béché, A., Verbeeck, J. (2020) Evaluation of different rectangular scan strategies for STEM imaging. Ultramicroscopy, 215. 113021pp. doi:10.1016/j.ultramic.2020.113021
Prabhakara, V., Jannis, D., Guzzinati, G., Béché, A., Bender, H., Verbeeck, J. (2020) HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale. Ultramicroscopy, 219. 113099pp. doi:10.1016/j.ultramic.2020.113099
Verbeeck, J., Tian, H., Béché, A. (2012) A new way of producing electron vortex probes for STEM. Ultramicroscopy, 113. 83-87 doi:10.1016/j.ultramic.2011.10.008
Béché, A., Juchtmans, R., Verbeeck, J. (2017) Efficient creation of electron vortex beams for high resolution STEM imaging. Ultramicroscopy, 178. 12-19 doi:10.1016/j.ultramic.2016.05.006
Jannis, D., Hofer, C., Gao, C., Xie, X., Béché, A., Pennycook, T.J., Verbeeck, J. (2022) Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications. Ultramicroscopy, 233. 113423pp. doi:10.1016/j.ultramic.2021.113423
Martinez, G.T., Jones, L., De Backer, A., Béché, A., Verbeeck, J., Van Aert, S., Nellist, P.D. (2015) Quantitative STEM normalisation: The importance of the electron flux. Ultramicroscopy, 159. 46-58 doi:10.1016/j.ultramic.2015.07.010
Verbeeck, Jo, Béché, Armand, Van den Broek, Wouter (2012) A holographic method to measure the source size broadening in STEM. Ultramicroscopy, 120. 35-40 doi:10.1016/j.ultramic.2012.05.007
Glaeser, Robert M. (2025) Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens. Ultramicroscopy, 271. doi:10.1016/j.ultramic.2025.114118
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Vanrompay, Hans, Skorikov, Alexander, Bladt, Eva, Béché, Armand, Freitag, Bert, Verbeeck, Johan, Bals, Sara (2021) Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges. Ultramicroscopy, 221. 113191pp. doi:10.1016/j.ultramic.2020.113191
 
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