(2010, May) IEEE Software Vol. 27 (3) Institute of Electrical and Electronics Engineers (IEEE)

Library Home Bookshelves View by Type Using Search

Books Catalogs/Sales Lists Journals Reports Thesis/Dissertation

Search for Books Search for Journals Manage Subjects Statistics Books without DDC/LCC Top Unstructured Orphaned Articles

Bookshelves (DDC layout)Bookshelves (LCC layout)Latest Books

Advanced

Search inside 'IEEE Software' only

- Only viewable:

Reference Type	Journal (issue)
Journal	IEEE Software
Year	2010 (May)	Volume	27
Issue	< 3 >
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Mindat Ref. ID	15422108	Long-form Identifier	mindat:1:5:15422108:9
GUID	0
Full Reference	(2010, May) IEEE Software Vol. 27 (3) Institute of Electrical and Electronics Engineers (IEEE)
Plain Text	(2010, May) IEEE Software Vol. 27 (3) Institute of Electrical and Electronics Engineers (IEEE)
In	(2010) IEEE Software Vol. 27. Institute of Electrical and Electronics Engineers (IEEE)

Contains

	*(2010) Table of Contents. IEEE Software, 27 (3) doi:10.1109/ms.2010.82*
	*(2010) Front Cover. IEEE Software, 27 (3) doi:10.1109/ms.2010.73*
	*(2010) Better Software Advertisement. IEEE Software, 27 (3) doi:10.1109/ms.2010.69*
	*(2010) Seapine Software Advertisement. IEEE Software, 27 (3) doi:10.1109/ms.2010.81*
	*Erdogmus, Hakan (2010) How Important Is Evidence, Really?. IEEE Software, 27 (3) 2-5 doi:10.1109/ms.2010.75*
	*Rising, Linda (2010) Telling Our Stories. IEEE Software, 27 (3) 6-7 doi:10.1109/ms.2010.83*
	*Bouchard, Lionel (2010) Multimedia Software for Mobile Phones. IEEE Software, 27 (3) 8-10 doi:10.1109/ms.2010.78*
	*Serrano, Nicolas, Torres, Jose Manuel (2010) Web 2.0 for Practitioners. IEEE Software, 27 (3) 11-15 doi:10.1109/ms.2010.84*
	*McGregor, John D., Muthig, Dirk, Yoshimura, Kentaro, Jensen, Paul (2010) Guest Editors' Introduction: Successful Software Product Line Practices. IEEE Software, 27 (3) 16-21 doi:10.1109/ms.2010.74*
	*Jones, Lawrence G., Northrop, Linda M. (2010) Clearing the Way for Software Product Line Success. IEEE Software, 27 (3) 22-28 doi:10.1109/ms.2010.71*
	*Bosch, Jan (2010) Toward Compositional Software Product Lines. IEEE Software, 27 (3) 29-34 doi:10.1109/ms.2010.32*
	*Jaejoon Lee, , Kotonya, Gerald (2010) Combining Service-Orientation with Product Line Engineering. IEEE Software, 27 (3) 35-41 doi:10.1109/ms.2010.30*
	*John, Isabel (2010) Using Documentation for Product Line Scoping. IEEE Software, 27 (3) 42-47 doi:10.1109/ms.2010.34*
	*Mohan, Kannan, Ramesh, Balasubramaniam, Sugumaran, Vijayan (2010) Integrating Software Product Line Engineering and Agile Development. IEEE Software, 27 (3) 48-55 doi:10.1109/ms.2010.31*
	*Kolb, Ronny, van der Linden, Frank (2010) Point/Counterpoint. IEEE Software, 27 (3) 56-59 doi:10.1109/ms.2010.80*
	*Kienle, Holger M (2010) It's About Time to Take JavaScript (More) Seriously. IEEE Software, 27 (3) 60-62 doi:10.1109/ms.2010.76*
	*Buschmann, Frank, Henney, Kevlin (2010) Five Considerations for Software Architecture, Part 1. IEEE Software, 27 (3) 63-65 doi:10.1109/ms.2010.72*
	*Wloka, Jan, Hoest, Einar, Ryder, Barbara G (2010) Tool Support for Change-Centric Test Development. IEEE Software, 27 (3) 66-71 doi:10.1109/ms.2009.159*
	*Christou, Ioannis, Ponis, Stavros, Palaiologou, Eleni (2010) Using the Agile Unified Process in Banking. IEEE Software, 27 (3) 72-79 doi:10.1109/ms.2009.156*
	*Usaola, Macario Polo, Mateo, Pedro Reales (2010) Mutation Testing Cost Reduction Techniques: A Survey. IEEE Software, 27 (3) 80-86 doi:10.1109/ms.2010.79*
	*Maiden, Neil, Jones, Sara (2010) Agile Requirements Can We Have Our Cake and Eat It Too?. IEEE Software, 27 (3) 87-88 doi:10.1109/ms.2010.67*
	*Babar, Muhammad Ali, Chen, Lianping, Shull, Forrest (2010) Managing Variability in Software Product Lines. IEEE Software, 27 (3) 89-91 doi:10.1109/ms.2010.77*
	*Kruchten, Philippe (2010) Certification 1, 2, 3. IEEE Software, 27 (3) 92-94 doi:10.1109/ms.2010.70*
	*Booch, Grady (2010) Architecture Reviews. IEEE Software, 27 (3) 96 doi:10.1109/ms.2010.68*

	*(2010, January) IEEE Software* Vol. 27 (1) Institute of Electrical and Electronics Engineers (IEEE)**
	*(2010, March) IEEE Software* Vol. 27 (2) Institute of Electrical and Electronics Engineers (IEEE)**
	*(2010, July) IEEE Software* Vol. 27 (4) Institute of Electrical and Electronics Engineers (IEEE)**
	*(2010, September) IEEE Software* Vol. 27 (5) Institute of Electrical and Electronics Engineers (IEEE)**
	*(2010, November) IEEE Software* Vol. 27 (6) Institute of Electrical and Electronics Engineers (IEEE)**
	*(2024, May) IEEE Software* Vol. 41 (3) Institute of Electrical and Electronics Engineers (IEEE)**
	*(1987, May) IEEE Software* Vol. 4 (3) Institute of Electrical and Electronics Engineers (IEEE)**
	*(1988, May) IEEE Software* Vol. 5 (3) Institute of Electrical and Electronics Engineers (IEEE)**
	*(1989, May) IEEE Software* Vol. 6 (3) Institute of Electrical and Electronics Engineers (IEEE)**
	*(1990, May) IEEE Software* Vol. 7 (3) Institute of Electrical and Electronics Engineers (IEEE)**
	*(1991, May) IEEE Software* Vol. 8 (3) Institute of Electrical and Electronics Engineers (IEEE)**

Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 2, 2025 23:34:18

Go to top of page

(2010, May) IEEE Software Vol. 27 (3) Institute of Electrical and Electronics Engineers (IEEE)

Contains

See Also