Usaola, Macario Polo, Mateo, Pedro Reales (2010) Mutation Testing Cost Reduction Techniques: A Survey. IEEE Software, 27 (3) 80-86 doi:10.1109/ms.2010.79
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Mutation Testing Cost Reduction Techniques: A Survey | ||
Journal | IEEE Software | ||
Authors | Usaola, Macario Polo | Author | |
Mateo, Pedro Reales | Author | ||
Year | 2010 (May) | Volume | 27 |
Issue | 3 | ||
Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
DOI | doi:10.1109/ms.2010.79Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 15422116 | Long-form Identifier | mindat:1:5:15422116:4 |
GUID | 0 | ||
Full Reference | Usaola, Macario Polo, Mateo, Pedro Reales (2010) Mutation Testing Cost Reduction Techniques: A Survey. IEEE Software, 27 (3) 80-86 doi:10.1109/ms.2010.79 | ||
Plain Text | Usaola, Macario Polo, Mateo, Pedro Reales (2010) Mutation Testing Cost Reduction Techniques: A Survey. IEEE Software, 27 (3) 80-86 doi:10.1109/ms.2010.79 | ||
In | (2010, May) IEEE Software Vol. 27 (3) Institute of Electrical and Electronics Engineers (IEEE) |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |