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Rajora, O. S., Curzon, A. E. (1984) On the effect of substrate temperature, deposition rate and annealing on the electrical resistivity of thin yttrium films. Journal of Materials Science Letters, 3 (7) 627-628 doi:10.1007/bf00719631

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Reference TypeJournal (article/letter/editorial)
TitleOn the effect of substrate temperature, deposition rate and annealing on the electrical resistivity of thin yttrium films
JournalJournal of Materials Science Letters
AuthorsRajora, O. S.Author
Curzon, A. E.Author
Year1984 (July)Volume3
Issue7
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00719631Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16408966Long-form Identifiermindat:1:5:16408966:2
GUID0
Full ReferenceRajora, O. S., Curzon, A. E. (1984) On the effect of substrate temperature, deposition rate and annealing on the electrical resistivity of thin yttrium films. Journal of Materials Science Letters, 3 (7) 627-628 doi:10.1007/bf00719631
Plain TextRajora, O. S., Curzon, A. E. (1984) On the effect of substrate temperature, deposition rate and annealing on the electrical resistivity of thin yttrium films. Journal of Materials Science Letters, 3 (7) 627-628 doi:10.1007/bf00719631
In(1984, July) Journal of Materials Science Letters Vol. 3 (7) Springer Science and Business Media LLC

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