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Proksch, Roger, Lefever, Joel, Wagner, Ryan (2023) Quantifying Electromechanics in Emerging Functional Materials: Electrostatics, Blind Spots and Precision. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 573 doi:10.1093/micmic/ozad067.276

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Reference TypeJournal (article/letter/editorial)
TitleQuantifying Electromechanics in Emerging Functional Materials: Electrostatics, Blind Spots and Precision
JournalMicroscopy and Microanalysis
AuthorsProksch, RogerAuthor
Lefever, JoelAuthor
Wagner, RyanAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.276Search in ResearchGate
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Mindat Ref. ID16636761Long-form Identifiermindat:1:5:16636761:4
GUID0
Full ReferenceProksch, Roger, Lefever, Joel, Wagner, Ryan (2023) Quantifying Electromechanics in Emerging Functional Materials: Electrostatics, Blind Spots and Precision. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 573 doi:10.1093/micmic/ozad067.276
Plain TextProksch, Roger, Lefever, Joel, Wagner, Ryan (2023) Quantifying Electromechanics in Emerging Functional Materials: Electrostatics, Blind Spots and Precision. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 573 doi:10.1093/micmic/ozad067.276
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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