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Saraf, L.V., Zhu, Z.H., Wang, C.M., Engelhard, M.H. (2009) Microstructure and secondary phase segregation correlation in epitaxial/oriented ZnO films with unfavorable Cr dopant. Journal of Materials Research, 24 (2) 506-515 doi:10.1557/jmr.2009.0054

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Reference TypeJournal (article/letter/editorial)
TitleMicrostructure and secondary phase segregation correlation in epitaxial/oriented ZnO films with unfavorable Cr dopant
JournalJournal of Materials Research
AuthorsSaraf, L.V.Author
Zhu, Z.H.Author
Wang, C.M.Author
Engelhard, M.H.Author
Year2009 (February)Volume24
Issue2
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1557/jmr.2009.0054Search in ResearchGate
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Mindat Ref. ID17103640Long-form Identifiermindat:1:5:17103640:6
GUID0
Full ReferenceSaraf, L.V., Zhu, Z.H., Wang, C.M., Engelhard, M.H. (2009) Microstructure and secondary phase segregation correlation in epitaxial/oriented ZnO films with unfavorable Cr dopant. Journal of Materials Research, 24 (2) 506-515 doi:10.1557/jmr.2009.0054
Plain TextSaraf, L.V., Zhu, Z.H., Wang, C.M., Engelhard, M.H. (2009) Microstructure and secondary phase segregation correlation in epitaxial/oriented ZnO films with unfavorable Cr dopant. Journal of Materials Research, 24 (2) 506-515 doi:10.1557/jmr.2009.0054
In(2009, February) Journal of Materials Research Vol. 24 (2) Springer Science and Business Media LLC

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