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Choi, Junha, Cho, Sung-Hak (2024) Ablation morphology and defect analysis of Ti thin film irradiated by femto- and picosecond laser for fine ablation of Micro-LED display thin film transistor repair. Applied Physics A, 130 (8) doi:10.1007/s00339-024-07714-1

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Reference TypeJournal (article/letter/editorial)
TitleAblation morphology and defect analysis of Ti thin film irradiated by femto- and picosecond laser for fine ablation of Micro-LED display thin film transistor repair
JournalApplied Physics A
AuthorsChoi, JunhaAuthor
Cho, Sung-HakAuthor
Year2024 (August)Volume130
Issue8
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-024-07714-1Search in ResearchGate
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Mindat Ref. ID17529042Long-form Identifiermindat:1:5:17529042:2
GUID0
Full ReferenceChoi, Junha, Cho, Sung-Hak (2024) Ablation morphology and defect analysis of Ti thin film irradiated by femto- and picosecond laser for fine ablation of Micro-LED display thin film transistor repair. Applied Physics A, 130 (8) doi:10.1007/s00339-024-07714-1
Plain TextChoi, Junha, Cho, Sung-Hak (2024) Ablation morphology and defect analysis of Ti thin film irradiated by femto- and picosecond laser for fine ablation of Micro-LED display thin film transistor repair. Applied Physics A, 130 (8) doi:10.1007/s00339-024-07714-1
In(2024, August) Applied Physics A Vol. 130 (8) Springer Science and Business Media LLC

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Choi, Junha, Cho, Sung-Hak (2024) Anisotropic conductive film (ACF) step-by-step line ablation using NIR, green, and DUV wavelengths femtosecond laser for Micro-LED display repair. Applied Physics A, 130 (9) doi:10.1007/s00339-024-07761-8
Choi, Junha, Cho, Kwangwoo, Cho, Sung-Hak (2024) Ablation morphology and characteristic analysis of anisotropic conductive film (ACF) using femtosecond lasers with NIR, Green, and DUV wavelengths for micro-LED display repair. Applied Physics A, 130 (2) doi:10.1007/s00339-024-07287-z
Shin, Young-Gwan, Choi, Junha, Cho, Sung-Hak (2023) Fine ablation with depth control of 25-nm resolution and morphologies irradiated by femtosecond laser pulses via beam shaping. Applied Physics A, 129 (8) doi:10.1007/s00339-023-06799-4
Kim, Hoon-Young, Choi, Won-Suk, Ji, Suk-Young, Shin, Young-Gwan, Jeon, Jin-Woo, Ahn, Sanghoon, Cho, Sung-Hak (2018) Morphologies of femtosecond laser ablation of ITO thin films using gaussian or quasi-flat top beams for OLED repair. Applied Physics A, 124. doi:10.1007/s00339-018-1553-1
Rublack, T., Hartnauer, S., Kappe, P., Swiatkowski, C., Seifert, G. (2011) Selective ablation of thin SiO2 layers on silicon substrates by femto- and picosecond laser pulses. Applied Physics A, 103. 43-50 doi:10.1007/s00339-011-6352-x
Labbe, William, Aspe, Barthélemy, Stolz, Arnaud, Cachoncinlle, Christophe, Semmar, Nadjib (2024) Formation of decorated LIPSS on GaN thin film by UV picosecond laser beam in air and under vacuum. Applied Physics A, 130 (10). doi:10.1007/s00339-024-07900-1
Rebegea, Simina Aurelia, Thomas, Keith, Chawla, Vipin, Michler, Johann, Kong, Ming Chu (2016) Laser ablation of a Cu–Al–Ni combinatorial thin film library: analysis of crater morphology and geometry. Applied Physics A, 122. doi:10.1007/s00339-016-0608-4
Kim, Jae-Gu, Cho, Sung-Hak, Je, Tae-Jin, Choi, Doo-Sun, Whang, Kyung-Hyun (2010) Surface pattern formation on Cr thin film with ultrafast laser pulse. Applied Physics A, 101. 345-348 doi:10.1007/s00339-010-5828-4
Sneftrup, Peter S., Hansen, John L., Balslev, Signe G., Balling, Peter (2024) Ultrashort-pulse-laser ablation of freestanding dielectric thin films. Applied Physics A, 130 (9). doi:10.1007/s00339-024-07792-1
Haas, Stefan, Schöpe, Gunnar, Zahren, Christoph, Stiebig, Helmut (2008) Analysis of the laser ablation processes for thin-film silicon solar cells. Applied Physics A, 92. 755-759 doi:10.1007/s00339-008-4560-9
Bellini, N., Geremia, R., Karnakis, D. (2017) Increasing laser pulse overlap restricts picosecond laser ablation of thin metal films near ablation threshold. Applied Physics A, 123. doi:10.1007/s00339-017-0971-9
 
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