Reference Type | Journal (article/letter/editorial) |
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Title | Selective ablation of thin SiO2 layers on silicon substrates by femto- and picosecond laser pulses |
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Journal | Applied Physics A |
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Authors | Rublack, T. | Author |
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Hartnauer, S. | Author |
Kappe, P. | Author |
Swiatkowski, C. | Author |
Seifert, G. | Author |
Year | 2011 (April) | Volume | 103 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/s00339-011-6352-xSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 6015004 | Long-form Identifier | mindat:1:5:6015004:8 |
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GUID | 0 |
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Full Reference | Rublack, T., Hartnauer, S., Kappe, P., Swiatkowski, C., Seifert, G. (2011) Selective ablation of thin SiO2 layers on silicon substrates by femto- and picosecond laser pulses. Applied Physics A, 103. 43-50 doi:10.1007/s00339-011-6352-x |
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Plain Text | Rublack, T., Hartnauer, S., Kappe, P., Swiatkowski, C., Seifert, G. (2011) Selective ablation of thin SiO2 layers on silicon substrates by femto- and picosecond laser pulses. Applied Physics A, 103. 43-50 doi:10.1007/s00339-011-6352-x |
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In | (2011) Applied Physics A Vol. 103. Springer Science and Business Media LLC |
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