Tracy, Brian D., Li, Xiang, Liu, Xinyu, Furdyna, Jacek, Dobrowolska, Margaret, Smith, David J. (2016) Characterization of structural defects in SnSe2 thin films grown by molecular beam epitaxy on GaAs (111)B substrates. Journal of Crystal Growth, 453. 58-64 doi:10.1016/j.jcrysgro.2016.06.022
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of structural defects in SnSe2 thin films grown by molecular beam epitaxy on GaAs (111)B substrates | ||
Journal | Journal of Crystal Growth | ||
Authors | Tracy, Brian D. | Author | |
Li, Xiang | Author | ||
Liu, Xinyu | Author | ||
Furdyna, Jacek | Author | ||
Dobrowolska, Margaret | Author | ||
Smith, David J. | Author | ||
Year | 2016 (November) | Volume | 453 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jcrysgro.2016.06.022Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 2912299 | Long-form Identifier | mindat:1:5:2912299:0 |
GUID | 0 | ||
Full Reference | Tracy, Brian D., Li, Xiang, Liu, Xinyu, Furdyna, Jacek, Dobrowolska, Margaret, Smith, David J. (2016) Characterization of structural defects in SnSe2 thin films grown by molecular beam epitaxy on GaAs (111)B substrates. Journal of Crystal Growth, 453. 58-64 doi:10.1016/j.jcrysgro.2016.06.022 | ||
Plain Text | Tracy, Brian D., Li, Xiang, Liu, Xinyu, Furdyna, Jacek, Dobrowolska, Margaret, Smith, David J. (2016) Characterization of structural defects in SnSe2 thin films grown by molecular beam epitaxy on GaAs (111)B substrates. Journal of Crystal Growth, 453. 58-64 doi:10.1016/j.jcrysgro.2016.06.022 | ||
In | (2016) Journal of Crystal Growth Vol. 453. Elsevier BV |
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