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Strauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, Stefan (2016) Analysis of grain structure evolution based on optical measurements of mc Si wafers. Journal of Crystal Growth, 454. 147-155 doi:10.1016/j.jcrysgro.2016.09.009

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of grain structure evolution based on optical measurements of mc Si wafers
JournalJournal of Crystal Growth
AuthorsStrauch, TheresaAuthor
Demant, MatthiasAuthor
Krenckel, PatriciaAuthor
Riepe, StephanAuthor
Rein, StefanAuthor
Year2016 (November)Volume454
PublisherElsevier BV
DOIdoi:10.1016/j.jcrysgro.2016.09.009Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID2912451Long-form Identifiermindat:1:5:2912451:8
GUID0
Full ReferenceStrauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, Stefan (2016) Analysis of grain structure evolution based on optical measurements of mc Si wafers. Journal of Crystal Growth, 454. 147-155 doi:10.1016/j.jcrysgro.2016.09.009
Plain TextStrauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, Stefan (2016) Analysis of grain structure evolution based on optical measurements of mc Si wafers. Journal of Crystal Growth, 454. 147-155 doi:10.1016/j.jcrysgro.2016.09.009
In(2016) Journal of Crystal Growth Vol. 454. Elsevier BV

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