Lee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2011) Phase Mixture and Reliability of BaTiO3-Based X7R Multilayer Ceramic Capacitors: X-Ray Diffractometry and Raman Spectroscopy. Journal of the American Ceramic Society, 94 (5). 1556-1562 doi:10.1111/j.1551-2916.2010.04248.x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Phase Mixture and Reliability of BaTiO3-Based X7R Multilayer Ceramic Capacitors: X-Ray Diffractometry and Raman Spectroscopy | ||
Journal | Journal of the American Ceramic Society | ||
Authors | Lee, Hwan-Wen | Author | |
Chu, Mike S. H. | Author | ||
Lu, Hong-Yang | Author | ||
Year | 2011 (May) | Volume | 94 |
Issue | 5 | ||
Publisher | Wiley | ||
DOI | doi:10.1111/j.1551-2916.2010.04248.xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4101831 | Long-form Identifier | mindat:1:5:4101831:6 |
GUID | 0 | ||
Full Reference | Lee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2011) Phase Mixture and Reliability of BaTiO3-Based X7R Multilayer Ceramic Capacitors: X-Ray Diffractometry and Raman Spectroscopy. Journal of the American Ceramic Society, 94 (5). 1556-1562 doi:10.1111/j.1551-2916.2010.04248.x | ||
Plain Text | Lee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2011) Phase Mixture and Reliability of BaTiO3-Based X7R Multilayer Ceramic Capacitors: X-Ray Diffractometry and Raman Spectroscopy. Journal of the American Ceramic Society, 94 (5). 1556-1562 doi:10.1111/j.1551-2916.2010.04248.x | ||
In | (2011, May) Journal of the American Ceramic Society Vol. 94 (5) Wiley |
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