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Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., Holzapfel, B. (2004) Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16. 842-845 doi:10.1021/cm031044k

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Reference TypeJournal (article/letter/editorial)
TitleTransmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO
JournalChemistry of Materials
AuthorsCao, G. H.Author
Simon, P.Author
Krämer, U.Author
Wimbush, S. C.Author
Holzapfel, B.Author
Year2004 (March)Volume16
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/cm031044kSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4299626Long-form Identifiermindat:1:5:4299626:0
GUID0
Full ReferenceCao, G. H., Simon, P., Krämer, U., Wimbush, S. C., Holzapfel, B. (2004) Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16. 842-845 doi:10.1021/cm031044k
Plain TextCao, G. H., Simon, P., Krämer, U., Wimbush, S. C., Holzapfel, B. (2004) Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16. 842-845 doi:10.1021/cm031044k
In(2004) Chemistry of Materials Vol. 16. American Chemical Society (ACS)

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Cao, G. H., Skrotzki, W., Simon, P., Wimbush, S. C., Holzapfel, B. (2005) Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi2B2C Thin Film. Chemistry of Materials, 17. 3558-3562 doi:10.1021/cm050006t
Cao, G.H., Simon, P., Skrotzki, W. (2004) Transmission electron microscopy study of YNi2B2C thin film growth on MgO(001) Journal of Materials Research, 19 (5) 1413-1416 doi:10.1557/jmr.2004.0189
Subba Rao, K., Tamm, R., Cao, G. H., Oertel, C.-G., Skrotzki, W., Wimbush, S. C., Holzapfel, B. (2006) Microstructure and texture of YNi2B2C thin films grown on Ir buffered MgO(001). Journal of Applied Physics, 100 (12). 123911pp. doi:10.1063/1.2403986
Cao, G.H., Simon, P., Skrotzki, W., Wimbush, S.C., Holzapfel, B. (2005) TEM Characterisation of YNi2B2C Thin Film Microstructure. Applied Physics A, 81. 583-585 doi:10.1007/s00339-004-2768-x
Bysakh, S., Mitsuishi, K., Song, M., Furuya, K., Chattopadhyay, K. (2004) Transmission Electron Microscopy and High-Resolution Transmission Electron Microscopy Study of Nanostructure and Metastable Phase Evolution in Pulsed-Laser-Ablation–Deposited Ti–Si Thin Film. Journal of Materials Research, 19 (4) 1118-1125 doi:10.1557/jmr.2004.0145
Seo, W.-S. (2004) High-resolution transmission electron microscopy study of Ca3Co4O9. Journal of Electron Microscopy, 53 (4). 397-401 doi:10.1093/jmicro/dfh046
Li, Y. H., Leach, C., Quincey, P. (1995) High resolution and analytical transmission electron microscopy study of growth processes in a YBCO thin film. Journal of Materials Science Letters, 14 (9) 670-673 doi:10.1007/bf00586174
Fang, L., Ricou, P., Korotkov, R. (2013) High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film. Microscopy and Microanalysis, 19. 1958-1959 doi:10.1017/s1431927613011781
Reibold, M, Wimbush, S.C, Holzapfel, B, Krämer, U (2002) Epitaxial growth of YNi2B2C films on single crystal MgO substrates: an HRTEM investigation of the interface. Journal of Alloys and Compounds, 347. 24-30 doi:10.1016/s0925-8388(02)00753-3
Kobayashi, Y. (2004) Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method. Journal of Electron Microscopy, 53 (5). 485-487 doi:10.1093/jmicro/dfh072
Wimbush, S. C., Holzapfel, B., Jooss, Ch. (2004) Observation of dendritic flux instabilities in YNi2B2C thin films. Journal of Applied Physics, 96 (6). 3589-3591 doi:10.1063/1.1778816
 
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