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Garming, Mathijs W. H., Weppelman, I. Gerward C., de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P., Moerland, Robert J. (2017) Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy. Nanoscale, 9. 12727-12734 doi:10.1039/c7nr00927e

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Reference TypeJournal (article/letter/editorial)
TitleNanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy
JournalNanoscale
AuthorsGarming, Mathijs W. H.Author
Weppelman, I. Gerward C.Author
de Boer, PascalAuthor
Martínez, Felipe PeronaAuthor
Schirhagl, RomanaAuthor
Hoogenboom, Jacob P.Author
Moerland, Robert J.Author
Year2017Volume9
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c7nr00927eSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4366013Long-form Identifiermindat:1:5:4366013:1
GUID0
Full ReferenceGarming, Mathijs W. H., Weppelman, I. Gerward C., de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P., Moerland, Robert J. (2017) Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy. Nanoscale, 9. 12727-12734 doi:10.1039/c7nr00927e
Plain TextGarming, Mathijs W. H., Weppelman, I. Gerward C., de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P., Moerland, Robert J. (2017) Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy. Nanoscale, 9. 12727-12734 doi:10.1039/c7nr00927e
In(2017) Nanoscale Vol. 9. Royal Society of Chemistry (RSC)

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Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730
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Zhang, Lixin, Garming, Mathijs W.H., Hoogenboom, Jacob P., Kruit, Pieter (2020) Beam displacement and blur caused by fast electron beam deflection. Ultramicroscopy, 211. 112925pp. doi:10.1016/j.ultramic.2019.112925
Weppelman, I.G.C., Moerland, R.J., Hoogenboom, J.P., Kruit, P. (2018) Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy. Ultramicroscopy, 184. 8-17 doi:10.1016/j.ultramic.2017.10.002
de Boer, Pascal, Hoogenboom, Jacob P, Giepmans, Ben N G (2015) Correlated light and electron microscopy: ultrastructure lights up!. Nature Methods, 12 (6). 503-513 doi:10.1038/nmeth.3400
 
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