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Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730

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Reference TypeJournal (article/letter/editorial)
TitleUltrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics
JournalMicroscopy and Microanalysis
AuthorsGarming, Mathijs W.H.Author
Weppelman, I.G. (Gerward) C.Author
Kruit, PieterAuthor
Hoogenboom, Jacob P.Author
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619010730Search in ResearchGate
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Mindat Ref. ID4887738Long-form Identifiermindat:1:5:4887738:3
GUID0
Full ReferenceGarming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730
Plain TextGarming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Garming, Mathijs W. H., Kruit, Pieter, Hoogenboom, Jacob P. (2022) Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy. Review of Scientific Instruments, 93 (9) 93702 doi:10.1063/5.0089086
(Gerward) Weppelman, I.G.C., Heerkens, C.T.H., Moerland, R.J., Hoogenboom, J.P., Kruit, P., van Tol, R.F.C. (2018) Creating Ultrafast Electron Pulses Using a Microfabricated Laser-Triggered Beam Blanker. Microscopy and Microanalysis, 24. 648-649 doi:10.1017/s1431927618003732
Narváez, Angela C., Weppelman, I. Gerward C., Moerland, Robert J., Hoogenboom, Jacob P., Kruit, Pieter (2014) Confocal filtering in cathodoluminescence microscopy of nanostructures. Applied Physics Letters, 104 (25). 251121pp. doi:10.1063/1.4885833
Zhang, Lixin, Garming, Mathijs W.H., Hoogenboom, Jacob P., Kruit, Pieter (2020) Beam displacement and blur caused by fast electron beam deflection. Ultramicroscopy, 211. 112925pp. doi:10.1016/j.ultramic.2019.112925
Garming, Mathijs W. H., Weppelman, I. Gerward C., de Boer, Pascal, Martínez, Felipe Perona, Schirhagl, Romana, Hoogenboom, Jacob P., Moerland, Robert J. (2017) Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy. Nanoscale, 9. 12727-12734 doi:10.1039/c7nr00927e
Kruit, Pieter, Krielaart, Maurice, van Staaden, Yuri (2019) Phase Contrast in Quantum Electron Microscopy. Microscopy and Microanalysis, 25. 1664-1665 doi:10.1017/s143192761900905x
Krielaart, Maurice, Kruit, Pieter (2019) Potentially Programmable Virtual Phase Plate for Electron Beams. Microscopy and Microanalysis, 25. 92-93 doi:10.1017/s1431927619001193
Weppelman, I.G.C., Moerland, R.J., Hoogenboom, J.P., Kruit, P. (2018) Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy. Ultramicroscopy, 184. 8-17 doi:10.1016/j.ultramic.2017.10.002
Kruit, Pieter, Zuidema, Wilco (2019) A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples. Microscopy and Microanalysis, 25. 1034-1035 doi:10.1017/s1431927619005907
Fermie, Job, Zuidema, Wilco, Å ejnoha, Radim, Wolters, Anouk, Giepmans, Ben, Hoogenboom, Jacob, Kruit, Pieter (2021) High-throughput imaging of biological samples with Delmic's FAST-EM. Microscopy and Microanalysis, 27. 558-560 doi:10.1017/s1431927621002439
Lane, Ryan, de Boer, Pascal, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2019) Integrated Array Tomography for High Throughput Electron Microscopy. Microscopy and Microanalysis, 25. 1038-1039 doi:10.1017/s1431927619005920
 
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