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Kruit, Pieter, Zuidema, Wilco (2019) A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples. Microscopy and Microanalysis, 25. 1034-1035 doi:10.1017/s1431927619005907

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Reference TypeJournal (article/letter/editorial)
TitleA Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples
JournalMicroscopy and Microanalysis
AuthorsKruit, PieterAuthor
Zuidema, WilcoAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619005907Search in ResearchGate
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Mindat Ref. ID4886727Long-form Identifiermindat:1:5:4886727:0
GUID0
Full ReferenceKruit, Pieter, Zuidema, Wilco (2019) A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples. Microscopy and Microanalysis, 25. 1034-1035 doi:10.1017/s1431927619005907
Plain TextKruit, Pieter, Zuidema, Wilco (2019) A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples. Microscopy and Microanalysis, 25. 1034-1035 doi:10.1017/s1431927619005907
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Fermie, Job, Zuidema, Wilco, Å ejnoha, Radim, Wolters, Anouk, Giepmans, Ben, Hoogenboom, Jacob, Kruit, Pieter (2021) High-throughput imaging of biological samples with Delmic's FAST-EM. Microscopy and Microanalysis, 27. 558-560 doi:10.1017/s1431927621002439
Zuidema, W., Rahangdale, S., Keizer, P., Hoogenboom, J.P., Kruit, P., Wolters, A., Giepmans, B.N.G. (2017) 10kfps Transmission Imaging in a 196 Beam SEM. Microscopy and Microanalysis, 23. 586-587 doi:10.1017/s1431927617003610
Zuidema, Wilco, Kruit, Pieter (2020) Transmission imaging on a scintillator in a scanning electron microscope. Ultramicroscopy, 218. 113055pp. doi:10.1016/j.ultramic.2020.113055
Zuidema, W, Hoogenboom, J P, Kruit, P (2017) Improved Image Quality in SEM Imaging of Thin Tissue Sections. Microscopy and Microanalysis, 23. 564-565 doi:10.1017/s1431927617003506
Stopka, Jan, Zuidema, Wilco, Kruit, Pieter (2021) Trajectory displacement in a multi beam scanning electron microscope. Ultramicroscopy, 223. 113223pp. doi:10.1016/j.ultramic.2021.113223
Kruit, Pieter, Ren, Yan (2016) Multi-Beam Scanning Electron Microscope Design. Microscopy and Microanalysis, 22. 574-575 doi:10.1017/s143192761600372x
Krielaart, Maurice, Kruit, Pieter (2019) Potentially Programmable Virtual Phase Plate for Electron Beams. Microscopy and Microanalysis, 25. 92-93 doi:10.1017/s1431927619001193
Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730
Arat, Kerim Tugrul, Bolten, Jens, Zonnevylle, Aernout Christiaan, Kruit, Pieter, Hagen, Cornelis Wouter (2019) Estimating Step Heights from Top-Down SEM Images. Microscopy and Microanalysis, 25 (4). 903-911 doi:10.1017/s143192761900062x
Kruit, Pieter, Krielaart, Maurice, van Staaden, Yuri (2019) Phase Contrast in Quantum Electron Microscopy. Microscopy and Microanalysis, 25. 1664-1665 doi:10.1017/s143192761900905x
Hornberger, Benjamin, Jacobsen, Chris, Feser, Michael (2004) Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy. Microscopy and Microanalysis, 10. 1034-1035 doi:10.1017/s1431927604880784
 
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