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Zuidema, W, Hoogenboom, J P, Kruit, P (2017) Improved Image Quality in SEM Imaging of Thin Tissue Sections. Microscopy and Microanalysis, 23. 564-565 doi:10.1017/s1431927617003506

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Reference TypeJournal (article/letter/editorial)
TitleImproved Image Quality in SEM Imaging of Thin Tissue Sections
JournalMicroscopy and Microanalysis
AuthorsZuidema, WAuthor
Hoogenboom, J PAuthor
Kruit, PAuthor
Year2017 (July)Volume23
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927617003506Search in ResearchGate
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Mindat Ref. ID4880004Long-form Identifiermindat:1:5:4880004:4
GUID0
Full ReferenceZuidema, W, Hoogenboom, J P, Kruit, P (2017) Improved Image Quality in SEM Imaging of Thin Tissue Sections. Microscopy and Microanalysis, 23. 564-565 doi:10.1017/s1431927617003506
Plain TextZuidema, W, Hoogenboom, J P, Kruit, P (2017) Improved Image Quality in SEM Imaging of Thin Tissue Sections. Microscopy and Microanalysis, 23. 564-565 doi:10.1017/s1431927617003506
In(2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP)

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Zuidema, W., Rahangdale, S., Keizer, P., Hoogenboom, J.P., Kruit, P., Wolters, A., Giepmans, B.N.G. (2017) 10kfps Transmission Imaging in a 196 Beam SEM. Microscopy and Microanalysis, 23. 586-587 doi:10.1017/s1431927617003610
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Haring, M.T., Liv, N., Zonnevylle, A.C., Narvaez, A.C., Kruit, P., Hoogenboom, J.P., Voortman, L.M. (2017) Integrated Microscopy: Highly Accurate Light-Electron Image Correlation Anywhere on a Sample. Microscopy and Microanalysis, 23. 1272-1273 doi:10.1017/s1431927617007024
Fermie, Job, Zuidema, Wilco, Ĺ ejnoha, Radim, Wolters, Anouk, Giepmans, Ben, Hoogenboom, Jacob, Kruit, Pieter (2021) High-throughput imaging of biological samples with Delmic's FAST-EM. Microscopy and Microanalysis, 27. 558-560 doi:10.1017/s1431927621002439
Garming, Mathijs W.H., Weppelman, I.G. (Gerward) C., Kruit, Pieter, Hoogenboom, Jacob P. (2019) Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics. Microscopy and Microanalysis, 25. 2000-2001 doi:10.1017/s1431927619010730
Holm, Jason (2017) Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging. Microscopy and Microanalysis, 23. 558-559 doi:10.1017/s1431927617003476
Wandrol, Petr, Slouf, Miroslav (2017) Polymer imaging in SEM—charge, damage and coating free. Microscopy and Microanalysis, 23. 1816-1817 doi:10.1017/s1431927617009746
Lifshin, Eric, Kande, Yudhishthir P., Moore, Richard L., Lyu, Siwei (2014) Improved SEM Image Resolution Through the Use of Image Restoration Techniques. Microscopy and Microanalysis, 20. 12-13 doi:10.1017/s1431927614001780
Scotuzzi, M., Kuipers, J., Wensveen, D., de Boer, P., Pirozzi, N., Hagen, C. W., Giepmans, B. N. G., Hoogenboom, J. P. (2017) Multi-Color Electron Microscopy by Element-Guided Identification of Cells, Organelles, and Molecules. Microscopy and Microanalysis, 23. 1300-1301 doi:10.1017/s1431927617007164
Hashimoto, Y, Muto, A, Shigeto, K, Ito, H, Itabashi, H, Ohno, M, Saito, T, Tachibana, S (2019) Development of in situ Imaging Capabilities in SEM and Their Applications. Microscopy and Microanalysis, 25. 564-565 doi:10.1017/s1431927619003556
Apkarian, R P (2005) On the Rapid Cryoimmobilization of Bulk Specimens for “Quality” Macromolecular Imaging by Low Temperature High Resolution SEM. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501533
 
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