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Lwin, Thaung (2007) Calibration in a closed system: the case of X-ray diffraction analysis. Journal of Applied Crystallography, 40 (4). 694-701 doi:10.1107/s0021889807023163

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Reference TypeJournal (article/letter/editorial)
TitleCalibration in a closed system: the case of X-ray diffraction analysis
JournalJournal of Applied Crystallography
AuthorsLwin, ThaungAuthor
Year2007 (August 1)Volume40
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889807023163Search in ResearchGate
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Mindat Ref. ID4670066Long-form Identifiermindat:1:5:4670066:1
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Full ReferenceLwin, Thaung (2007) Calibration in a closed system: the case of X-ray diffraction analysis. Journal of Applied Crystallography, 40 (4). 694-701 doi:10.1107/s0021889807023163
Plain TextLwin, Thaung (2007) Calibration in a closed system: the case of X-ray diffraction analysis. Journal of Applied Crystallography, 40 (4). 694-701 doi:10.1107/s0021889807023163
In(2007, August) Journal of Applied Crystallography Vol. 40 (4) International Union of Crystallography (IUCr)

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Braun, G. E. (1986) A Monte Carlo error simulation applied to calibration-free X-ray diffraction phase analysis. Journal of Applied Crystallography, 19 (4) 217-221 doi:10.1107/s0021889886089549
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Sumner Makin, O., Sikorski, Pawel, Serpell, Louise C. (2007) CLEARER: a new tool for the analysis of X-ray fibre diffraction patterns and diffraction simulation from atomic structural models. Journal of Applied Crystallography, 40 (5). 966-972 doi:10.1107/s0021889807034681
Toussaint, C. J. (1971) A high-temperature X-ray diffraction study of the NiO–Li2O system. Journal of Applied Crystallography, 4 (4) 293-297 doi:10.1107/s0021889871007003
Rodriguez, Mark A., Keenan, Michael R., Nagasubramanian, Ganesan (2007) In situX-ray diffraction analysis of (CFx)nbatteries: signal extraction by multivariate analysis. Journal of Applied Crystallography, 40 (6). 1097-1104 doi:10.1107/s0021889807042045
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Szabó, P. (1982) Addenda to the optimization of quantitative X-ray diffraction analysis. Journal of Applied Crystallography, 15 (4) 449-451 doi:10.1107/s0021889882012345
Davis, B. L., Spilde, M. N. (1990) Quantitative X-ray powder diffraction analysis applied to transmission diffraction. Journal of Applied Crystallography, 23 (4). 315-320 doi:10.1107/s0021889890003879
 
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